On the Recovery Time of Highly Robust Low-Noise Amplifiers
Author: | Armin Liero, Mike Dewitz, Silvio Kühn, Nidhi Chaturvedi, Jijun Xu, Matthias Rudolph |
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DOI: | https://doi.org/10.1109/TMTT.2010.2041519 |
ISSN: | 0018-9480 |
Title of the source (English): | IEEE transactions on microwave theory and techniques |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2010 |
Tag: | Amplifier noise; integrated circuit (MMIC) amplifiers; integrated circuit noise; microwave field-effect transistor (FET) amplifiers; monolithic microwave integrated circuit (MMIC) amplifiers; noise; semiconductor device noise |
Volume/Year: | 58 |
Issue number: | 4 |
First Page: | 781 |
Last Page: | 787 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik |
Institution name at the time of publication: | Fakultät für Maschinenbau, Elektrotechnik und Wirtschaftsingenieurwesen (eBTU) / Ulrich-Rohde-Stiftungsprofessur für Hochfrequenz- und Mikrowellentechnik |