Low Leakage Highly Stable Robust Ultra Low Power 8T SRAM Ce
Author: | Neha Gupta, Tanisha Gupta, Sajid Khan, Abhinav Vishwakarma, Santosh Kumar Vishvakarma |
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DOI: | https://doi.org/10.1007/978-981-32-9767-8_53 |
ISBN: | 978-981-32-9766-1 |
ISBN: | 978-981-32-9767-8 |
Title of the source (English): | VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers |
Publisher: | Springer |
Place of publication: | Singapore |
Document Type: | Conference publication not peer-reviewed |
Language: | English |
Year of publication: | 2019 |
First Page: | 643 |
Last Page: | 654 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |