MetadatenAuthor: | Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Nevin George, Stephen Adeboye Oyeniran, Tsotne Putkaradze, Apneet Kaur, Jaan Raik, Gert Jervan, Raimund Ubar, Thomas Hollstein |
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DOI: | https://doi.org/10.1109/DDECS.2017.7934565 |
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ISBN: | 978-1-5386-0472-4 |
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ISBN: | 978-1-5386-0473-1 |
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ISSN: | 2473-2117 |
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Title of the source (English): | IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Dresden, Germany, 19-21 April 2017 |
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Document Type: | Conference publication peer-reviewed |
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Language: | English |
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Year of publication: | 2017 |
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Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
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