Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics
| Author: | Martin Kittler, Tzanimir V. ArguirovGND, Reiner P. Schmid, Winfried Seifert |
|---|---|
| ISBN: | 978-1-61503-041-5 |
| ISBN: | 0-61503-041-7 |
| Title of the source (English): | ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010 |
| Publisher: | ASM International Materials Park |
| Place of publication: | Texas, USA |
| Document Type: | Conference Proceeding |
| Language: | English |
| Year of publication: | 2010 |
| Tag: | Photoluminescence |
| First Page: | 137 |
| Last Page: | 142 |
| Faculty/Chair: | Fakultät 2 Umwelt und Naturwissenschaften / AG Physikalische Chemie II |
