TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Henyk, Matthias A1 - Pandelov, Stanislaw T1 - Surface morphology after femtosecond laser ablation of insulators T2 - High-power laser ablation IV, 22 - 26 April 2002, Taos, USA, pt. 2 Y1 - 2002 SN - 0-8194-4524-X SP - 980 EP - 985 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Henyk, Matthias A1 - Costache, Florenta Adriana A1 - Reif, Jürgen T1 - Ultra short laser pulse ablation from sodium chloride - the role of laser induced color centers T2 - Applied Surface Science Y1 - 2002 SN - 0169-4332 VL - 197-198 SP - 90 EP - 95 ER - TY - GEN A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Henyk, Matthias A1 - Pandelov, Stanislaw T1 - Ripples Revisited: Non-Classical Morphology at the Bottom of Femtosecond Laser Ablation Craters in Transparent Dielectrics T2 - Applied surface science Y1 - 2002 SN - 0169-4332 VL - Vol. 197–198 SP - 891 EP - 895 ER - TY - GEN A1 - Arguirov, Tzanimir V. A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Temperature behaviour of photoluminescence and electron-beam-induced current recombination behaviour of extended defects in solar grade silicon T2 - Journal of Physics: Condensed Matter Y1 - 2002 SN - 1361-648X SN - 0953-8984 VL - 14 IS - 48 SP - 13169 EP - 13177 ER - TY - GEN A1 - Pandelov, Stanislaw A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Analysis of local electric properties of grain boundaries in Si by electron-beam-induced-current techniques T2 - Journal of Physics: Condensed Matter Y1 - 2002 SN - 0953-8984 VL - 14 IS - 48 SP - 13161 EP - 13168 ER - TY - GEN A1 - Wolfframm, Dirk A1 - Ratzke, Markus A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Praseodymium Oxide growth on Si(100) by pulsed laser deposition T2 - Materials Science and Semiconductor Processing Y1 - 2002 SN - 1369-8001 VL - 5 IS - 4-5 SP - 429 EP - 434 ER - TY - GEN A1 - Orlov, Valeri A1 - Richter, Hans A1 - Fischer, Annette A1 - Reif, Jürgen A1 - Müller, T. A1 - Wahlich, R. T1 - Mechanical Properties of nitrogen-doped CZ silicon crystals T2 - Materials Science in Semiconductor Processing 5 Y1 - 2002 SN - 1369-8001 VL - 5 IS - 4-5 SP - 403 EP - 407 ER - TY - CHAP A1 - Schmid, Reiner P. A1 - Reif, Jürgen T1 - All-Optical Full Logic Unit with Femtosecond Switching T2 - Second International Symposium on Laser Precision Microfabrication, 16 - 18 May 2001, Singapore Y1 - 2002 SN - 0-8194-4137-6 U6 - https://doi.org/10.1117/12.456869 SP - S. 460 PB - SPIE CY - Bellingham, Wash. ER - TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Henyk, Matthias T1 - Sub-Picosecond Ion emission from Transparent Dielectrics T2 - Second International Symposium on Laser Precision Microfabrication, 16 - 18 May 2001, Singapore Y1 - 2002 SN - 0-8194-4137-6 SP - S. 82 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Costache, Florenta Adriana A1 - Henyk, Matthias A1 - Reif, Jürgen T1 - Modification of Dielectric Surfaces with Ultra-Short Laser Pulses T2 - Applied Surface Science Y1 - 2002 SN - 0169-4332 VL - 186 IS - 1-4 SP - 352 EP - 357 ER - TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Raman Measurement of Stress Distribution in Multicrystalline Silicon Materials T2 - Materials Science and Engineering B Y1 - 2003 SN - 0921-5107 VL - 102 IS - 1/3 SP - 37 EP - 42 ER - TY - GEN A1 - Reif, Jürgen A1 - Schmid, Reiner P. A1 - Schneider, Thomas T1 - Femtosecond Third Harmonic Generation: Self Phase Matching through a Transient Kerr Grating and the Way to Ultrafast Computing T2 - Applied Physics B Y1 - 2002 U6 - https://doi.org/10.1007/s003400200847 SN - 0946-2171 SN - 1432-0649 VL - 74 IS - 7 SP - 745 EP - 748 ER - TY - GEN A1 - Henyk, Matthias A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Ultrafast laser desorption from transparent insulators T2 - Nuclear Instruments and Methods in Physic Research B Y1 - 2000 SN - 0168-583x VL - 166/167 SP - 716 EP - 721 ER - TY - CHAP A1 - Reif, Jürgen A1 - Henyk, Matthias A1 - Wolfframm, Dirk T1 - Explosive Femtosecond Ablation from Ionic Crystals T2 - Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA Y1 - 2000 SN - 0-8194-3550-3 SP - S. 26 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Henyk, Matthias A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Ultra short laser pulse induced charged particle emission from wide bandgap crystals T2 - Applied Surface Science Y1 - 2000 SN - 0169-4332 VL - 168 IS - 1/4 SP - 263 EP - 266 ER - TY - GEN A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Mitzner, Rolf A1 - Reif, Jürgen T1 - Ultrafast optical switching by instantaneous laser-induced grating formation and self-diffraction in barium flouride T2 - Applied Physics B Y1 - 1999 SN - 0946-2171 VL - 68 IS - 4 SP - 749 EP - 751 ER - TY - GEN A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Ultrafast optical switching by instantaneous laser-induced grating formation and self-diffraction in barium flouride T2 - Physica status solidi (a) Y1 - 1999 SN - 0031-8965 SN - 1862-6300 VL - 175 IS - 1 SP - 177 EP - 182 ER - TY - CHAP A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Reif, Jürgen ED - Andersen, Peter E. ED - Johansen, P. M. ED - Pedersen, H. C. ED - Petersen, P. M. ED - Saffman, M. T1 - Highly Efficient, Ultrafast Laser Beam Manipulation by Laser Induced Index Grating in Barium Fluoride T2 - Advances in photorefractive materials, effects and devices, from the Seventh Topical Meeting on Photorefractive Materials, Effects and Devices, June 27 - 30, 1999, Elsinore, Denmark Y1 - 1999 SN - 1-55752-606-0 SP - S. 306 PB - Optical Society of America CY - Washington, DC ER - TY - CHAP A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Mitzner, Rolf A1 - Reif, Jürgen T1 - Ultrafast Transient Grating in Barium Fluoride T2 - Novel lasers and devices - basic aspects, 14 - 16 June 1999, ICM, Internationales Congress Center München, Munich, Germany Y1 - 1999 SP - S. 145 PB - Optical Society of America CY - Washington, DC ER - TY - GEN A1 - Henyk, Matthias A1 - Vogel, N. A1 - Wolfframm, Dirk A1 - Tempel, A. A1 - Reif, Jürgen T1 - Femtosecond Laser Ablation from Dielectric Materials: Comparison to Arc Discharge Erosion T2 - Applied Physics A Y1 - 1999 SN - 0947-8396 VL - 69 IS - Suppl. 1 SP - 355 EP - 358 ER - TY - GEN A1 - Henyk, Matthias A1 - Costache, Florenta Adriana A1 - Reif, Jürgen T1 - Femtosecond Laser Ablation from Sodium Chloride and Barium Fluoride T2 - Applied Surface Science Y1 - 2002 SN - 0169-4332 VL - 186 IS - 1-4 SP - 381 EP - 384 ER - TY - GEN A1 - Schmid, Reiner P. A1 - Schneider, Thomas A1 - Reif, Jürgen T1 - Femtosecond All-optical Wavelength and Time Demultiplexer for OTDM/WDM Systems T2 - Applied Physics B Y1 - 2002 UR - http://link.springer.com/article/10.1007/s00340-002-0876-x U6 - https://doi.org/10.1007/s00340-002-0876-x SN - 0946-2171 SN - 1432-0649 VL - 74 IS - Suppl. 1 SP - 205 EP - 208 ER - TY - GEN A1 - Schmid, Reiner P. A1 - Schneider, Thomas A1 - Reif, Jürgen T1 - Optical Processing on a Femtosecond Time Scale T2 - Optics Communication Y1 - 2002 SN - 0030-4018 VL - 207 IS - 1-6 SP - 155 EP - 160 ER - TY - GEN A1 - Reif, Jürgen A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Schmid, Reiner P. T1 - Femtosecond nonlinear optical characterization of silicon wafers: the role of symmetry T2 - Materials Science in Semiconductor Processing Y1 - 2001 SN - 1369-8001 VL - 4 IS - 1-3 SP - 241 EP - 243 ER - TY - GEN A1 - Reif, Jürgen A1 - Schmid, Reiner P. A1 - Schneider, Thomas A1 - Wolfframm, Dirk T1 - Nonlinear Characterization of the Surface of Silicon Wafers: In-situ Detection of External Stress T2 - Solid State Electronics 44 Y1 - 2000 SN - 0038-1101 VL - 44 IS - 5 SP - 809 EP - 813 ER - TY - GEN A1 - Henyk, Matthias A1 - Mitzner, Rolf A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Laser Induced Ion Emission from Dielectrics T2 - Applied Surface Science Y1 - 2000 SN - 0169-4332 VL - 154-155 SP - 249 EP - 255 ER - TY - GEN A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Mitzner, Rolf A1 - Reif, Jürgen T1 - Femtosecond Index Grating in Barium Fluoride: Efficient Self Diffraction and Enhancement of Surface SHG T2 - Applied Surface Science Y1 - 2000 SN - 0169-4332 VL - 154-155 SP - 565 EP - 570 ER - TY - GEN A1 - Schneider, Thomas A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Ultrafast laser-induced index grating in transparent insulators T2 - Nuclear Instruments and Methods B Y1 - 2000 SN - 0168-583x VL - 166-167 SP - 809 EP - 814 ER - TY - CHAP A1 - Reif, Jürgen ED - Miotello, Antonio ED - Ossi, Paolo M. T1 - Basic Physics of Femtosecond Laser Ablation T2 - Laser-surface interactions for new materials production Y1 - 2010 SN - 978-3-642-03306-3 SN - 978-3-642-03307-0 SP - 19 EP - 41 PB - Springer CY - Berlin [u.a.] ER - TY - CHAP A1 - Reif, Jürgen A1 - Varlamova, Olga A1 - Bounhalli, Mourad A1 - Arguirov, Tzanimir V. A1 - Schade, M. A1 - Leipner, Hartmut S. T1 - Long-time feedback in self-organized nanostructures formation upon multipulse femtosecond laser ablation T2 - Synthesis and photonics of nanoscale materials VII, 26 - 28 January 2010, San Francisco, California, United States Y1 - 2010 SN - 978-0-8194-7982-2 SP - 7586OH PB - SPIE CY - Bellingham, Wash. ER - TY - THES A1 - Mai, Andreas T1 - Integration von LDMOS-Transistoren für Hochfrequenzanwendungen in eine 0.13 µm-SiGe:C-BiCMOS Technologie Y1 - 2010 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-20740 ER - TY - THES A1 - Ohlerich, Martin T1 - Investigations of the Physics Potential and Detector Development for the ILC Y1 - 2010 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-14409 ER - TY - THES A1 - Lublow, Michael T1 - Surface Analytical Characterization of Horizontal and Vertical Nanotopographies at the Silicon/Silicon Oxide/Electrolyte Phase Boundaries Y1 - 2009 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-14390 ER - TY - THES A1 - Schneider, Thomas T1 - Transientes ultraschnelles Brechungsindexgitter in Barium-Fluorid: Der Einfluß des Gitters auf nichtlineare optische Phänomene Y1 - 2000 SN - 3-8265-8060-5 PB - Shaker CY - Aachen ER - TY - THES A1 - Krüger, Jörg T1 - Ultrakurze Laserimpulse in der Mikromaterialbearbeitung Y1 - 2000 SN - 3-89825-034-2 PB - dissertation.de CY - Berlin ER - TY - THES A1 - Varlamova, Olga T1 - Self-organized surface patterns originating from femtosecond laser-induced instability Y1 - 2013 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-29530 SN - 978-3-95404-604-1 PB - Cuvillier CY - Göttingen ER - TY - THES A1 - Schmidtbauer, Jan T1 - MBE Growth and Characterization of Germanium Nanowires Y1 - 2012 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-28660 ER - TY - THES A1 - Ratzke, Markus T1 - Kraftmikroskopie als Werkzeug zur Charakterisierung elektrischer Oberflächeneigenschaften Y1 - 2012 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-24440 ER - TY - THES A1 - Trushin, Maxim T1 - Electronic properties of interfaces produced by silicon wafer hydrophilic bonding Y1 - 2011 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-22841 ER - TY - THES A1 - Jia, Guobin T1 - Characterization of electrical and optical properties of silicon based materials Y1 - 2009 ER - TY - THES A1 - Wiatrek, Andrzej T1 - Untersuchung der Eigenschaften der gesättigten stimulierten Brillouin-Streuung und ihrer Anwendeungsmöglichkeiten Y1 - 2013 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-29577 ER - TY - THES A1 - Hartmann, Carsten T1 - Aluminiumnitrid-Volumenkristallzüchtung mittels physikalischen Gasphasentransports Y1 - 2013 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-28992 ER - TY - GEN A1 - Gregorcic, Peter A1 - Sedlacek, Marko A1 - Podgornik, Bojan A1 - Reif, Jürgen T1 - Formation of laser-induced periodic surface structures (LIPPS) on tool steel by multiple picosecond laser pulses of different polarizations T2 - Applied Surface Science Y1 - 2016 SN - 0169-4332 VL - 387 SP - 698 EP - 706 ER - TY - GEN A1 - Reif, Jürgen A1 - Varlamova, Olga A1 - Uhlig, Sebastian A1 - Varlamov, Sergej A1 - Bestehorn, Michael T1 - On the physics of self-organized nanostructure formation upon femtosecond laser ablation T2 - Applied Physics A N2 - We present new results on femtosecond LIPSS on silicon, fostering the dynamic model of self-organized structure formation. The first set of experiments demonstrates LIPSS formation by irradiation with a femtosecond white light continuum. The ripples are, as usual, perpendicular to the light polarization with a fluence-dependent wavelength between 500 and 700 nm. At higher dose (fluence × number of shots), the LIPSS turn to much coarser structures. The second set of experiments displays the dose dependence of pattern evolution at about threshold fluence. In contrast to the general case of multi-pulse LIPSS, where a strong dependence of the structures on the laser polarization is observed, single-shot exposition of silicon at about the ablation threshold results in a concentric pattern of very regular sub-wavelength ripples following the oval shape of the irradiated spot, without any reference to the laser polarization. When increasing the number of pulses, the usual, typical ripples develop and then coalesce into broader perpendicular structures, interlaced with remnants of the first, finer ripples. Y1 - 2014 UR - http://link.springer.com/article/10.1007/s00339-014-8339-x U6 - https://doi.org/10.1007/s00339-014-8339-x SN - 0947-8396 SN - 1432-0630 VL - 117 IS - 1 SP - 179 EP - 184 ER - TY - GEN A1 - Obrosov, Aleksei A1 - Gulyaev, Roman A1 - Zak, Andrzej A1 - Ratzke, Markus A1 - Naveed, Muhammad A1 - Dudzinski, Wlodzimierz A1 - Weiß, Sabine T1 - Chemical and Morphological Characterization of Magnetron Sputtered at Different Bias Voltages Cr-Al-C Coatings T2 - Materials N2 - MAX phases (M = transition metal, A = A-group element, and X = C/N) are of special interest because they possess a unique combination of the advantages of both metals and ceramics. Most attention is attracted to the ternary carbide Cr2AlC because of its excellent high-temperature oxidation, as well as hot corrosion resistance. Despite lots of publications, up to now the influence of bias voltage on the chemical bonding structure, surface morphology, and mechanical properties of the film is still not well understood. In the current study, Cr-Al-C films were deposited on silicon wafers (100) and Inconel 718 super alloy by dc magnetron sputtering with different substrate bias voltages and investigated using Scanning Electron Microscopy (SEM), X-ray Photoelectron Spectroscopy (XPS), X-ray Diffraction (XRD), Atomic Force Microscopy (AFM), and nanoindentation. Transmission Electron Microscopy (TEM) was used to analyze the correlation between the growth of the films and the coating microstructure. The XPS results confirm the presence of Cr2AlC MAX phase due to a negative shift of 0.6–0.9 eV of the Al2p to pure aluminum carbide peak. The XRD results reveal the presence of Cr2AlC MAX Phase and carbide phases, as well as intermetallic AlCr2. The film thickness decreases from 8.95 to 6.98 µm with increasing bias voltage. The coatings deposited at 90 V exhibit the lowest roughness (33 nm) and granular size (76 nm) combined with the highest hardness (15.9 GPa). The ratio of Al carbide to carbide-like carbon state changes from 0.12 to 0.22 and correlates with the mechanical properties of the coatings. TEM confirms the columnar structure, with a nanocrystalline substructure, of the films. KW - XPS KW - AFM KW - MAX phase KW - TEM KW - chemical bonding KW - surface morphology Y1 - 2017 UR - http://www.mdpi.com/1996-1944/10/2/156/htm U6 - https://doi.org/10.3390/ma10020156 SN - 1996-1944 VL - 10 IS - 2 SP - 156 ER - TY - GEN A1 - Obrosov, Aleksei A1 - Gulyaev, Roman A1 - Ratzke, Markus A1 - Volinsky, Alex A. A1 - Bolz, Sebastian A1 - Naveed, Muhammad A1 - Weiß, Sabine T1 - XPS and AFM Investigations of Ti-Al-N Coatings Fabricated Using DC Magnetron Sputtering at Various Nitrogen Flow Rates and Deposition Temperatures T2 - Metals N2 - Ti-Al-N coatings were deposited by direct current magnetron sputtering (DCMS) onto IN 718 at different nitrogen flow rates and deposition temperatures. The coatings’ properties were characterized using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) as well as nanoindentation. It was found that higher deposition temperature leads to higher surface roughness and nitrogen flux influences the shape of grains. According to XPS, the bonding structure of all coatings exhibited the (Ti,Al)N phase. Mechanical properties depend on the Al content within the films. The coating with the best mechanical properties (deposited at 500 °C and 20 standard cubic centimeters per minute (sccm)) was further deposited onto tungsten carbide (WC) cutting tools for cylindrical turning experiments. A quasi-constant flank wear was observed until a machining volume of 23,500 mm³. KW - Ti-Al-N coatings KW - DC magnetron sputtering KW - XPS KW - AFM KW - nitrogen flow rate KW - surface morphology Y1 - 2017 UR - http://www.mdpi.com/2075-4701/7/2/52/htm U6 - https://doi.org/10.3390/met7020052 SN - 2075-4701 VL - 7 IS - 2 SP - 52 ER - TY - GEN A1 - Borcia, Rodica A1 - Borcia, Ion-Dan A1 - Bestehorn, Michael A1 - Varlamova, Olga A1 - Hoefner, Kevin A1 - Reif, Jürgen T1 - Drop Behavior Influenced by the Correlation Length on Noisy Surfaces T2 - Langmuir Y1 - 2019 U6 - https://doi.org/10.1021/acs.langmuir.8b03878 VL - 35 SP - 928 EP - 934 ER - TY - CHAP A1 - Reif, Jürgen ED - Ossi, Paolo M. T1 - Surface Functionalization by Laser-Induced Structuring T2 - Advances in the Application of Lasers in Materials Science Y1 - 2018 SN - 978-3-319-96844-5 U6 - https://doi.org/10.1007/978-3-319-96845-2_3 SP - 63 EP - 88 PB - Springer CY - Cham ER - TY - GEN A1 - Varlamova, Olga A1 - Hoefner, Kevin A1 - Ratzke, Markus A1 - Reif, Jürgen A1 - Sarker, Debasish T1 - Modification of surface properties of solids by femtosecond LIPSS writing: comparative studies on silicon and stainless steel T2 - Applied Physics A Y1 - 2017 U6 - https://doi.org/10.1007/s00339-017-1362-y SN - 0947-8396 SN - 1432-0630 VL - 123 IS - 12 ER - TY - GEN A1 - Czajkowski, Klaus A1 - Ratzke, Markus A1 - Varlamova, Olga A1 - Reif, Jürgen T1 - Femtosecond-laser-induced periodic surface structures on magnetic layer targets: The roles of femtosecond-laser interaction and of magnetization T2 - Applied Surface Science Y1 - 2017 U6 - https://doi.org/10.1016/j.apsusc.2017.03.148 SN - 0169-4332 VL - 417 SP - 84 EP - 87 ER - TY - GEN A1 - Varlamova, Olga A1 - Reif, Jürgen A1 - Stolz, Michael A1 - Borcia, Rodica A1 - Borcia, Ion-Dan A1 - Bestehorn, Michael T1 - Wetting properties of LIPSS structured silicon surfaces T2 - The European Physical Journal B N2 - The controlled dynamics of liquid drops via generation of specific wetting states on a solid surface is of great interests both in the fundamental and applied sciences. Considering that the wettability is strongly dependent on the surface topography and surface roughness, we investigate – through experiments and theory – the effect of laser-induced periodic surface structures (LIPSS) generated on silicon (100) targets as a control parameter of wetting properties. To obtain structured silicon surfaces with different morphological features, we patterned the surface by irradiation with femtosecond pulses from an amplified Ti:Sapphire laser system (790 nm/100 fs/1 kHz) at a fluence in the range of 0.4–1.2 J/cm2 on a spot with a diameter about of 100 μm. Variation of the applied irradiation dose results in surface modifications with the roughness about of a few tens of nanometers are ranging from regular LIPSS patterns with the lateral period of about 500–700 nm to complex agglomerations of 3-D microstructures with several-μm feature size. The theoretical study on the correlation of wetting properties with the surface topography has been performed within a phase field model. We found an excellent agreement of numerical results with experiments. Y1 - 2019 U6 - https://doi.org/10.1140/epjb/e2019-90672-2 SN - 1434-6036 SN - 1434-6028 VL - 92 IS - 5 ER - TY - GEN A1 - Schlipf, Jon A1 - Martin, Elena A1 - Stchakovsky, Michel A1 - Benedetti, Alessandro A1 - Fischer, Inga Anita A1 - Schulze, Jörg A1 - Chiussi, Stefano T1 - Ellipsometric analysis of concentration gradients induced in semiconductor crystals by pulsed laser induced epitaxy T2 - Journal of Vacuum Science & Technology B Y1 - 2019 U6 - https://doi.org/10.1116/1.5122777 SN - 2166-2754 VL - 37 IS - 6 ER - TY - GEN A1 - Funk, Hannes S. A1 - Kern, Michael A1 - Weisshaupt, David A1 - Sürgers, Christoph A1 - Fischer, Inga Anita A1 - Oehme, Michael A1 - Slageren, Joris van A1 - Schulze, Jörg T1 - Magnetic Characterization of a Mn Based Ferromagnet on SixGe(1-x-y)Sny with High Sn Content T2 - ECS Transactions Y1 - 2019 U6 - https://doi.org/10.1149/09301.0101ecst SN - 1938-5862 SN - 1938-6737 VL - 93 IS - 1 SP - 101 EP - 104 ER -