TY - THES A1 - Pflanz, Matthias T1 - Online error detection and fast recover techniques for dependable embedded processors Y1 - 2002 SN - 3-540-43318-X PB - Springer CY - Berlin [u.a.] ER - TY - CHAP A1 - Schölzel, Mario A1 - Bachmann, Peter A1 - Vierhaus, Heinrich Theodor ED - Dabrowski, Adam T1 - Application Specific Processor Design for Digital Signal Processing T2 - Signal processing '2004, workshop proceedings, Poznan, 24th September 2004 Y1 - 2004 SN - 83-913251-5-6 SP - 7 EP - 15 PB - Poznan Univ. of Technology CY - Poznan ER - TY - CHAP A1 - Pflanz, Matthias A1 - Vierhaus, Heinrich Theodor T1 - Control Signal Protection - A New Challenge for High Performance Processors T2 - Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece Y1 - 2003 SN - 0-7695-1968-7 SP - 173 EP - 177 PB - IEEE Computer Society CY - Los Alamitos, Calif. [u.a.] ER - TY - CHAP A1 - Vierhaus, Heinrich Theodor A1 - Rossmann, Helmut T1 - Power-Timing Optimierung für Zellen-basierte Digitalschaltungen in Submikron-Technologien T2 - Informatik 2005 - Informatik LIVE!, Beiträge der 35. Jahrestagung der Gesellschaft für Informatik e.V., 19. - 22. September 2005 in Bonn, Bd. 1 Y1 - 2005 SN - 3-88579-396-2 SP - 339 EP - 343 PB - Gesellschaft für Informatik CY - Bonn ER - TY - GEN A1 - Vierhaus, Heinrich Theodor A1 - Pflanz, Matthias A1 - Mohaupt, Thomas T1 - Design and Architecture of Dependable Computer-Based Systems Y1 - 2000 ER - TY - CHAP A1 - Galke, Christian A1 - Pflanz, Matthias A1 - Vierhaus, Heinrich Theodor T1 - A Test Processor Concept for Systems-on-a-Chip Y1 - 2002 ER - TY - CHAP A1 - Galke, Christian A1 - Grabow, M. A1 - Vierhaus, Heinrich Theodor T1 - Kompaktierung von Testmustern für den Test von SoCs mittels einer Testprozessor-Architektur Y1 - 2003 ER - TY - CHAP A1 - Galke, Christian A1 - Grabow, M. A1 - Vierhaus, Heinrich Theodor T1 - Test Pattern De-/Compaction for SoC Test in a Test Processor Environment Y1 - 2003 ER - TY - CHAP A1 - Galke, Christian A1 - Grabow, M. A1 - Vierhaus, Heinrich Theodor T1 - Perspectives of combining online and offline test technology for dependable systems on a chip T2 - Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece Y1 - 2003 SN - 0-7695-1968-7 SP - 183 EP - 187 PB - IEEE CY - Los Alamitos, Calif. [u.a.] ER - TY - CHAP A1 - Kretzschmar, Claudia A1 - Galke, Christian A1 - Vierhaus, Heinrich Theodor T1 - A Hierarchical Self Test Scheme for SoCs Y1 - 2004 ER -