TY - CHAP A1 - Rudolph, Matthias A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Heymann, Peter T1 - Influence of 2 GHz Harmonic Load-Pull on HBT and MESFET Output Power and Efficiency T2 - 1999 IEEE MTT-S International Microwave Symposium digest, June 13 - 19, 1999, Anaheim Convention Center, Anaheim, California Y1 - 1999 SN - 0-7803-5135-5 SP - 741 EP - 744 PB - Piscataway, NJ CY - IEEE ER - TY - CHAP A1 - Rudolph, Matthias A1 - Dörner, Ralf A1 - Heymann, Peter A1 - Lenk, Friedrich T1 - Modeling of Low-Frequency Noise in GaInP/GaAs Hetero-Bipolar-Transistors T2 - 2001 IEEE MTT-S International Microwave Symposium digest, May 20 - 25, 2001, Phoenix Civic Plaza, Phoenix, AZ, 1967 - 1970, Vol.3 Y1 - 2001 SN - 0-7803-6538-0 SP - 1967 EP - 1970 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - CHAP A1 - Lenk, Friedrich A1 - Rudolph, Matthias T1 - New Extraction Algorithm for GaAs-HBTs With Low Intrinsic Base Resistance T2 - IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention & Trade Center, Seattle, Washington, Vol. 2 Y1 - 2002 SN - 0-7803-7239-5 SP - 725 EP - 728 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - CHAP A1 - Rudolph, Matthias A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Heymann, Peter T1 - Towards a Unified Method to Implement Transit-Time Effects in Pi-Topology HBT CompactModels T2 - IEEE MTT-S International Microwave Symposium digest, June 2 - 7, 2002, Washington State Convention & Trade Center, Seattle, Washington, Vol. 2 Y1 - 2002 SN - 0-7803-7239-5 SP - 997 EP - 1000 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - GEN A1 - Rudolph, Matthias A1 - Lenk, Friedrich A1 - Llopis, O. A1 - Heinrich, Wolfgang T1 - On the Simulation of Low-Frequency Noise Upconversion in InGaP/GaAs HBTs T2 - IEEE transactions on microwave theory and techniques Y1 - 2006 SN - 0018-9480 VL - 54 IS - 7 SP - 2954 EP - 2961 ER - TY - GEN A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Rumiantsev, Andrej T1 - Sensitivity Analysis of S-Parameter Measurements Due to Calibration Standards Uncertainty T2 - IEEE Transactions on Microwave Theory and Techniques Y1 - 2013 U6 - https://doi.org/10.1109/TMTT.2013.2279774 SN - 0018-9480 VL - 61 IS - 10 SP - 3800 EP - 3807 ER - TY - CHAP A1 - Rumiantsev, Andrej A1 - Dörner, Ralf A1 - Lenk, Friedrich T1 - Impact of in-situ TRL reference impedance determination on parameter extraction T2 - Microwave Conference (EuMC), 2012 42nd European, Amsterdam, Netherlands, 29 October - 1 November 2012 N2 - This paper investigates the impact of possible parameter extraction errors caused by inaccurate definition of the calibration reference impedance of in-situ multiline TRL. Two calibration sets implemented on GaAs and Si/SiGe:C wafer processes were quantitatively analyzed. Obtained results demonstrated that for most practical cases, the desired 5%-level of confidence of extracted parameters of high-reflective devices can easily be achieved without additional efforts. Thus, implementation of the in-situ TRL into a characterization workflow of high-performance microwave devices can be significantly simplified. Y1 - 2012 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6459080 SN - 978-1-4673-2215-7 SN - 978-2-87487-026-2 SP - 593 EP - 596 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Kurpas, Paul A1 - Rumiantsev, Andrej T1 - Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration T2 - Microwave Measurement Conference (ARFTG), 2013 81st ARFTG Y1 - 2013 SN - 978-1-4673-4981-9 U6 - https://doi.org/10.1109/ARFTG.2013.6579057 SP - 1 EP - 4 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Rumiantsev, Andrej A1 - Rudolph, Matthias T1 - Calibration Residual Error Propagation Analysis Using Conformal Mapping T2 - 77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011 Y1 - 2011 SN - 978-1-61284-959-1 PB - Piscataway, NJ CY - IEEE ER -