TY - GEN A1 - Schmid, Reiner P. A1 - Mankovics, Daniel A1 - Arguirov, Tzanimir V. A1 - Ratzke, Markus A1 - Mtchedlidze, T. A1 - Kittler, Martin T1 - Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature T2 - Physica Status Solidi : A Y1 - 2011 U6 - https://doi.org/10.1002/pssa.201026269 SN - 1610-1642 VL - 208 IS - 4 SP - 888 EP - 892 ER - TY - GEN A1 - Schmid, Reiner P. A1 - Mankovics, Daniel A1 - Arguirov, Tzanimir V. A1 - Mtchedlidze, T. A1 - Kittler, Martin T1 - Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches Y1 - 2011 ER - TY - CHAP A1 - Muth, Marco A1 - Schmid, Reiner P. A1 - Schnitzlein, Klaus T1 - Specific modifications to enhance sensitivity in null-ellipsometry T2 - Book of abstracts, 8th Workshop Ellipsometry, March 10 - 12, 2014, Dresden, Germany Y1 - 2014 UR - http://www.ipfdd.de/fileadmin/user_upload/ax/OEA/8th_Workshop_Ellipsometry/Book%20of%20abstracts.pdf SP - S. 84 ER - TY - GEN A1 - Wolfframm, Dirk A1 - Kouteva-Arguirova, Simona A1 - Arguirov, Tzanimir V. A1 - Schmid, Reiner P. A1 - Dittmar, K. A1 - Zienert, I. A1 - Reif, Jürgen T1 - Hafnium oxide on silicon: A non-destructive characterization of the interfacial layer T2 - Solid State Phenomena Y1 - 2004 UR - http://www.scientific.net/SSP.95-96.653.pdf SN - 1662-9779 SN - 0377-6883 VL - 95-96 SP - 653 EP - 658 ER - TY - CHAP A1 - Muth, Marco A1 - Schmid, Reiner P. A1 - Schnitzlein, Klaus T1 - Einfache Methode zur Steigerung der Empfindlichkeit in Null-Ellipsometrie T2 - DPG Frühjahrstagung 2013 in Regensburg Y1 - 2013 UR - http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/ds/session/30/contribution/10 PB - DPG CY - Bad Honnef ER - TY - CHAP A1 - Reif, Jürgen A1 - Schneider, Thomas A1 - Schmid, Reiner P. A1 - Wolfframm, Dirk ED - Helvajian, Henry T1 - Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress T2 - Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA Y1 - 2000 SN - 0-8194-3550-3 PB - SPIE CY - Bellingham, Wash. ER - TY - CHAP A1 - Reif, Jürgen A1 - Schmid, Reiner P. T1 - Efficient instantaneous optical switching, frequency conversion and simple logic operations on a femtosecond time scale T2 - 25th International Congress on High-Speed Photography and Photonics, 29 September - 4 October 2002, Beaune, France Y1 - 2003 UR - http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=889727 SN - 0-8194-4744-7 U6 - https://doi.org/10.1117/12.516816 SP - 137 EP - 140 PB - SPIE CY - Bellingham, Wash. ER - TY - JOUR A1 - Reif, Jürgen A1 - Schmid, Reiner P. A1 - Schneider, Thomas A1 - Wolfframm, Dirk T1 - Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress Y1 - 2000 ER -