TY - JOUR A1 - Ratzke, Markus A1 - Yang, B. A1 - Reif, Jürgen T1 - Fixed charge densitiy distribution on pulsed laser deposited high-k oxide layers Y1 - 2008 ER - TY - CHAP A1 - Bär, Marcus A1 - Starr, David E. A1 - Lambertz, Andreas A1 - Holländer, B. A1 - Alsmeier, Jan Hendrik A1 - Weinhardt, Lothar A1 - Blum, Mia A1 - Gorgoi, Mihaela A1 - Yang, Wooyong A1 - Wilks, Regan G. A1 - Heske, Clemens ED - Eldada, Louay A. ED - Heben, Michael J. T1 - Microcrystalline silicon oxides for silicon-based solar cells: Impact of the O/Si ratio on the electronic structure T2 - Thin films for solar and energy technology VI : 17, 18 and 20 August 2014, San Diego, California, United States Y1 - 2014 SN - 978-1-62841-204-8 U6 - https://doi.org/10.1117/12.2061902 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Sullivan, J. T. A1 - Wilks, Regan G. A1 - Winkler, M. T. A1 - Weinhardt, Lothar A1 - Recht, D. A1 - Said, A. J. A1 - Newman, B. K. A1 - Zhang, Y. A1 - Blum, Monika A1 - Krause, S. A1 - Yang, Wan Li A1 - Heske, Clemens A1 - Aziz, M. J. A1 - Bär, Marcus A1 - Buonassisi, T. T1 - Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur N2 - We apply soft x-ray emission spectroscopy (XES) to measure the electronic structure of crystalline silicon supersaturated with sulfur (up to 0.7 at. %), a candidate intermediate-band solar cell material. Si L2,3 emission features are observed above the conventional Si valence band maximum, with intensity scaling linearly with S concentration. The lineshape of the S-induced features change across the insulator-to-metal transition, indicating a significant modification of the local electronic structure concurrent with the change in macroscopic electronic behavior. The relationship between the Si L2,3 XES spectral features and the anomalously high sub-band gap infrared absorption is discussed. KW - black silicon KW - solar cells KW - electronic surface structure KW - x-ray emission spectroscopy Y1 - 2011 ER -