TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Orlov, Valeri A1 - Seifert, Winfried A1 - Richter, Hans A1 - Reif, Jürgen T1 - Residual stress distribution and silicon phase transformation induced by Rockwell indentation at different temperatures, studied by means of micro-Raman spectroscopy T2 - Solid State Phenomena Y1 - 2004 SN - 1662-9779 SN - 0377-6883 VL - 95-96 SP - 513 EP - 518 ER - TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Eckert, Sebastian A1 - Kouteva-Arguirova, Simona A1 - Bestehorn, Michael A1 - Georgescu, Ionut A1 - Semorek, A. F. A1 - Martin, P. A1 - Gobert, O. A1 - Seifert, Winfried T1 - Formation of self-organized regular nanostructures upon femtosecond laser ablation T2 - Fifth International Symposium on Laser Precision Microfabrication, 11 - 14 May, 2004, Nara, Japan Y1 - 2004 SN - 0-8194-5623-3 SP - S. 737 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Arguirov, Tzanimir V. A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Temperature behaviour of photoluminescence and electron-beam-induced current recombination behaviour of extended defects in solar grade silicon T2 - Journal of Physics: Condensed Matter Y1 - 2002 SN - 1361-648X SN - 0953-8984 VL - 14 IS - 48 SP - 13169 EP - 13177 ER - TY - GEN A1 - Pandelov, Stanislaw A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Analysis of local electric properties of grain boundaries in Si by electron-beam-induced-current techniques T2 - Journal of Physics: Condensed Matter Y1 - 2002 SN - 0953-8984 VL - 14 IS - 48 SP - 13161 EP - 13168 ER - TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Raman Measurement of Stress Distribution in Multicrystalline Silicon Materials T2 - Materials Science and Engineering B Y1 - 2003 SN - 0921-5107 VL - 102 IS - 1/3 SP - 37 EP - 42 ER - TY - CHAP A1 - Kittler, Martin A1 - Arguirov, Tzanimir V. A1 - Schmid, Reiner P. A1 - Seifert, Winfried T1 - Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics T2 - ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010 KW - Photoluminescence Y1 - 2010 SN - 978-1-61503-041-5 SN - 0-61503-041-7 SP - 137 EP - 142 PB - ASM International Materials Park CY - Texas, USA ER -