TY - CHAP A1 - Vierhaus, Heinrich Theodor A1 - Stamenković, Zoran ED - Oklobdzija, Vojin G. T1 - Test Technology for Sequential Circuits T2 - Digital design and fabrication Y1 - 2007 PB - CRC Press CY - Boca Raton ER - TY - BOOK A1 - Vierhaus, Heinrich Theodor A1 - Steininger, Andreas A1 - Pawlak, A. A1 - Kraemer, Rolf A1 - Schölzel, Mario A1 - Raik, Jaan T1 - Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems Y1 - 2011 SN - 978-1-4244-9753-9 PB - Piscataway : IEEE, 2011 ER -