TY - GEN A1 - Gupta, Neha A1 - Gupta, Tanisha A1 - Khan, Sajid A1 - Vishwakarma, Abhinav A1 - Vishvakarma, Santosh Kumar T1 - Low Leakage Highly Stable Robust Ultra Low Power 8T SRAM Ce T2 - VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers Y1 - 2019 SN - 978-981-32-9766-1 SN - 978-981-32-9767-8 U6 - https://doi.org/10.1007/978-981-32-9767-8_53 SP - 643 EP - 654 PB - Springer CY - Singapore ER -