TY - CHAP A1 - Andjelkovic, Marko A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic T2 - IEEE East-West Design & Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018 Y1 - 2018 SN - 978-1-5386-5709-6 U6 - https://doi.org/10.1109/EWDTS.2018.8524748 PB - IEEE CY - Piscataway, NJ ER -