TY - PAT A1 - Stamenković, Zoran A1 - Kraemer, Rolf A1 - Krstic, Milos A1 - Tittelbach-Helmrich, Klaus A1 - Ignacio, S. A1 - Javier, V. A1 - Jesus, P. A1 - Jesus, I. T1 - MIMO Transmission in IEEE 802.11 WLAN Systems Y1 - 2009 ER - TY - CHAP A1 - Elvira, Victor A1 - Ibáñez, Jesús A1 - Santamaria, I. A1 - Krstic, Milos A1 - Tittelbach-Helmrich, Klaus A1 - Stamenković, Zoran T1 - Baseband Processor for RF-MIMO WLAN Y1 - 2010 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Tittelbach-Helmrich, Klaus A1 - Krstic, Milos A1 - Ibáñez, Jesús A1 - Elvira, Victor A1 - Santamaria, I. T1 - MAC and Baseband Hardware Platforms for RF-MIMO WLAN Y1 - 2010 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Tittelbach-Helmrich, Klaus A1 - Krstic, Milos A1 - Perez, J. A1 - Via, J. A1 - Ibáñez, Jesús T1 - Architecture of an Analog Combining MIMO System Compliant to IEEE 802.11a Y1 - 2009 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro Y1 - 2017 SP - S. 184 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190065 SP - 35 EP - 44 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic T2 - IEEE East-West Design & Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018 Y1 - 2018 SN - 978-1-5386-5709-6 U6 - https://doi.org/10.1109/EWDTS.2018.8524748 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Andjelkovic, Marko A1 - Li, Yuanqing A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019 Y1 - 2019 SN - 978-1-7281-2490-2 SN - 978-1-7281-2489-6 SN - 978-1-7281-2491-9 U6 - https://doi.org/10.1109/IOLTS.2019.8854379 SN - 1942-9401 PB - IEEE ER - TY - GEN A1 - Andjelkovic, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Stamenkovic, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems T2 - 18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020 Y1 - 2020 SN - 978-1-7281-9899-6 SN - 978-1-7281-9898-9 SN - 978-1-7281-9900-9 U6 - https://doi.org/10.1109/EWDTS50664.2020.9225138 SN - 2472-761X PB - IEEE ER -