TY - CHAP A1 - Kittler, Martin A1 - Arguirov, Tzanimir V. A1 - Schmid, Reiner P. A1 - Seifert, Winfried T1 - Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics T2 - ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010 KW - Photoluminescence Y1 - 2010 SN - 978-1-61503-041-5 SN - 0-61503-041-7 SP - 137 EP - 142 PB - ASM International Materials Park CY - Texas, USA ER -