TY - GEN A1 - Bauer, J. A1 - Yamamoto, Yuji A1 - Zaumseil, Peter A1 - Fursenko, Oksana A1 - Schulz, K. A1 - Kozłowski, Grzegorz A1 - Schubert, Markus Andreas A1 - Schroeder, Thomas A1 - Tillack, Bernd T1 - Nanostructured Silicon for Ge Nanoheteroepitaxy T2 - Microelectronics Engineering Y1 - 2012 SN - 0167-9317 VL - 97 SP - 169 EP - 172 ER - TY - GEN A1 - Capellini, Giovanni A1 - Kozłowski, Grzegorz A1 - Yamamoto, Yuji A1 - Lisker, Marco A1 - Tillack, Bernd A1 - Ghrib, A. A1 - Kersauson, M. de A1 - El Kurdi, M. A1 - Boucaud, P. A1 - Schroeder, Thomas T1 - Tensile strained Ge layers obtained via Si-CMOS compatible approach T2 - Journal of Applied Physics Y1 - 2013 VL - 113 IS - 1 SP - 013513-1 EP - 013513-6 ER - TY - GEN A1 - Virgilio, Michele A1 - Manganelli, Constanza Lucia A1 - Grosso, G. A1 - Schroeder, Thomas A1 - Capellini, Giovanni T1 - Photoluminescence, recombination rate, and gain spectra in optically excited n-type and tensile strained germanium layers T2 - Journal of Applied Physics Y1 - 2013 SN - 0021-8979 VL - 114 IS - 24 SP - 243102 EP - 243102-11 ER - TY - GEN A1 - Wilkens, Henrik A1 - Rodewald, Jari A1 - Gevers, Sebastian A1 - Zöllner, Marvin Hartwig A1 - Schroeder, Thomas A1 - Wollschläger, Joachim T1 - Surface morphology of ultra-thin hex-Pr2O3 films on Si(111) T2 - Journal of Physics : D, Applied Physics Y1 - 2013 SN - 0022-3727 VL - 46 IS - 28 SP - 285306 EP - 285313 ER - TY - GEN A1 - Wang, P. A1 - Liang, O. A1 - Zhang, Wei A1 - Schroeder, Thomas A1 - Xie, Y. H. T1 - Ultra-Sensitive Graphene-Plasmonic Hybrid Platform for Label-Free Detection T2 - Advanced Materials Y1 - 2013 SN - 1521-4095 VL - 25 IS - 35 SP - 4918 EP - 4924 ER - TY - GEN A1 - Zaumseil, Peter A1 - Kozłowski, Grzegorz A1 - Yamamoto, Yuji A1 - Schubert, Markus Andreas A1 - Schroeder, Thomas T1 - X-ray Characterization of Ge Dots Epitaxially Grown on Nano-structured Si Islands on SOI Substrates T2 - Journal of Applied Crystallography Y1 - 2013 SN - 0021-8898 VL - 46 IS - 4 SP - 868 EP - 873 ER - TY - GEN A1 - Niu, Gang A1 - Zaumseil, Peter A1 - Schubert, Markus Andreas A1 - Zöllner, Marvin Hartwig A1 - Dabrowski, Jarek Marek A1 - Schroeder, Thomas T1 - Lattice-matched single crystalline ternary PrxY2-xO3 films on SrO-passivated Si (001): interface engineering and crystallography tailoring T2 - Applied Physics Letters Y1 - 2013 VL - 102 SP - 011906-1 EP - 011906-5 ER - TY - GEN A1 - Niermann, T. A1 - Zengler, D. A1 - Tarnawska, Lidia Lupina A1 - Storck, Peter A1 - Schroeder, Thomas T1 - Virtual GaN substrates via Sc2O3/Y2O3 buffers on Si(111): TEM Characterization of growth defects T2 - Journal of Applied Physics Y1 - 2013 SN - 0021-8979 VL - 113 IS - 22 SP - 223501 EP - 223501-8 ER - TY - GEN A1 - Wilkens, Henrik A1 - Schuckmann, O. A1 - Oelke, R. A1 - Gevers, Sebastian A1 - Schaefer, A. A1 - Bäumer, Marcus A1 - Zöllner, Marvin Hartwig A1 - Schroeder, Thomas A1 - Wollschläger, Joachim T1 - Stabilization of the ceria Jota-phase Ce7O12 surface on Si(111) T2 - Applied Physics Letters Y1 - 2013 SN - 0003-6951 VL - 102 IS - 11 SP - 111602-1 EP - 111602-3 ER - TY - GEN A1 - Wilkens, Henrik A1 - Schuckmann, O. A1 - Oelke, R. A1 - Gevers, Sebastian A1 - Reichling, M. A1 - Schaefer, A. A1 - Bäumer, Marcus A1 - Zöllner, Marvin Hartwig A1 - Niu, Gang A1 - Schroeder, Thomas A1 - Wollschläger, Joachim T1 - Structural transitions of epitaxial ceria films on Si(111) T2 - Physical Chemistry Chemical Physics Y1 - 2013 SN - 1463-9084 VL - 15 IS - 42 SP - 18589 EP - 18599 ER -