TY - CHAP A1 - Schoof, Gunther A1 - Methfessel, Michael A1 - Kraemer, Rolf T1 - High ASIC Reliability by Using Fault-Tolerant Design Techniques Y1 - 2010 ER - TY - CHAP A1 - Schoof, Gunther A1 - Methfessel, Michael A1 - Kraemer, Rolf T1 - Fault-Tolerant ASIC Design for High System Reliability Y1 - 2010 ER - TY - CHAP A1 - Petrovic, Vladimir A1 - Schoof, Gunther T1 - Design Flow Approach for Reliable Asic Designs Y1 - 2010 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Panic, Goran A1 - Schoof, Gunther T1 - A System-on-Chip for Wireless Body Area Sensor Network Node Y1 - 2008 ER - TY - CHAP A1 - Montenegro, S. A1 - Schoof, Gunther A1 - Haririan, E. T1 - Network Centric Core Avionics Y1 - 2009 ER - TY - CHAP A1 - Schoof, Gunther T1 - Fault-tolerant ASIC Design for High System Dependability Y1 - 2009 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Wolf, Ch. A1 - Schoof, Gunther A1 - Gaisler, J. T1 - An Implementation Study on Fault-Tolerant LEON-3 Processor System Y1 - 2006 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Dietterle, Daniel A1 - Panic, Goran A1 - Bocer, W. A1 - Schoof, Gunther A1 - Ebert, Jean-Pierre T1 - MAC Processor for BASUMA Wireless Body Area Network Y1 - 2007 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Wolf, Ch. A1 - Schoof, Gunther A1 - Gaisler, J. T1 - LEON-2: General Purpose Processor for a Wireless Engine Y1 - 2006 ER - TY - CHAP A1 - Panic, Goran A1 - Stamenković, Zoran A1 - Tittelbach-Helmrich, Klaus A1 - Lehmann, J. A1 - Schoof, Gunther T1 - Design of Wireless Systems Utilizing Scratchpad Memories Y1 - 2005 ER - TY - PAT A1 - Schoof, Gunther A1 - Kraemer, Rolf T1 - Integrierte Schaltung mit Schaltungsschutz Y1 - 2006 ER - TY - CHAP A1 - Stamenković, Zoran A1 - Panic, Goran A1 - Jagdhold, Ulrich A1 - Frankenfeldt, Horst A1 - Tittelbach-Helmrich, Klaus A1 - Schoof, Gunther A1 - Kraemer, Rolf T1 - Modular Processor: A Flexible Library of ASIC Modules Y1 - 2004 ER - TY - CHAP A1 - Petrovic, Vladimir A1 - Schoof, Gunther A1 - Montenegro, S. T1 - Middleware Switch ASIC Implementation Y1 - 2011 ER - TY - GEN A1 - Bertaud, Thomas A1 - Walczyk, Damian A1 - Sowinska, Małgorzata A1 - Wolansky, Dirk A1 - Tillack, Bernd A1 - Schoof, Gunther A1 - Korolevych, R. A1 - Wenger, Christian A1 - Thiess, Sebastian A1 - Schroeder, Thomas A1 - Walczyk, Christian T1 - HfO2-based RRAM for Embedded Nonvolatile Memory: From Materials Science to Integrated 1T1R RRAM Arrays T2 - ECS transactions Y1 - 2012 SN - 1938-6737 VL - 50 IS - 4 SP - 21 EP - 26 ER - TY - CHAP A1 - Simevski, Aleksandar A1 - Schleisiek, Klaus A1 - Petrovic, Vladimir A1 - Beller, Norbert A1 - Skoncej, Patryk A1 - Schoof, Gunther A1 - Krstic, Milos T1 - Implementation of a Real Time Unit for Satellite Applications T2 - 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 20-22 April 2016, Kosice, Slovakia Y1 - 2016 SN - 978-1-5090-2467-4 SP - 180 PB - IEEE CY - Piscataway, NJ ER - TY - PAT A1 - Schoof, Gunther A1 - Petrovic, Vladimir T1 - Design Flow fehlertolerantes ASIC-Design Y1 - 2009 ER - TY - CHAP A1 - Petrovic, Vladimir A1 - Ilic, M. A1 - Schoof, Gunther A1 - Montenegro, S. T1 - Implementation of Middleware Switch ASIC Processor Y1 - 2011 ER - TY - CHAP A1 - Schoof, Gunther A1 - Kraemer, Rolf A1 - Jagdhold, Ulrich A1 - Wolf, Ch. T1 - Radiation-hardened ASIC Design for Real-time Applications Y1 - 2007 ER - TY - CHAP A1 - Schoof, Gunther A1 - Kraemer, Rolf A1 - Jagdhold, Ulrich A1 - Wolf, Ch. T1 - Fault-Tolerant Design for Applications Exposed to Radiation Y1 - 2007 ER - TY - PAT A1 - Schoof, Gunther T1 - Elektrischer Schaltkreis mit Doppel-Modul-Redundanz zur Handhabung von Single-Event-Effekten Y1 - 2007 ER - TY - PAT A1 - Schoof, Gunther T1 - Integrierte Schaltung mit Strahlungsschutz Y1 - 2007 ER - TY - PAT A1 - Schoof, Gunther T1 - Improved FT Design Y1 - 2008 ER - TY - GEN A1 - Grossi, Alessandro A1 - Walczyk, Damian A1 - Zambelli, Cristian A1 - Miranda, Enrique A1 - Olivo, Piero A1 - Stikanov, V. A1 - Feriani, A. A1 - Sune, J. A1 - Schoof, Gunther A1 - Kraemer, Rolf A1 - Tillack, Bernd A1 - Fox, A. A1 - Schroeder, Thomas A1 - Walczyk, Christian T1 - Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays T2 - IEEE Transaction on Electronic Devices Y1 - 2015 U6 - https://doi.org/10.1109/TED.2015.2442412 SN - 0018-9383 VL - 62 IS - 8 SP - 2502 EP - 2509 ER -