TY - GEN A1 - Jinks, Clare A1 - Botto-van Bemden, Angie A1 - Bunzli, Samantha A1 - Bowden, Jocelyn A1 - Egerton, Thorlene A1 - Eyles, Jillian A1 - Foster, Nadine A1 - Healey, Emma L. A1 - Maddison, John A1 - O’Brien, Daniel A1 - Quicke, Jonathan G. A1 - Schiphof, Dieuwke A1 - Parry, Emma A1 - Thomas, Martin J. A1 - Holden, Melanie A. A1 - Allen, Kelli A1 - Babatunde, Opeyemi O. A1 - Bennel, Kim L. A1 - Berry, Alice A1 - Bierma-Zeinstra, Sita A1 - Callahan, Leigh A1 - Campbell, Laura A1 - Dziedzic, Krysia S. A1 - Finney, Andrew A1 - French, Helen P. A1 - Haber, Travis A1 - Hadley-Barrows, Tina A1 - Hall, Michelle A1 - Hawker, Gillian A1 - Henriksen, Marius A1 - Hinman, Rana S. A1 - Ho-Pham, Lan A1 - Hunter, David J. A1 - Lawford, Belinda J. A1 - Mallen, Christian D. A1 - McHugh, Gretl A. A1 - Kopkow, Christian A1 - Neogi, Tuhina A1 - Nicholls, Elaine A1 - Nicolson, Philippa J. A. A1 - Østerås, Nina A1 - Paskins, Zoe A1 - Protheroe, Joanne A1 - Roos, Ewa M. A1 - Runhaar, Jos A1 - Skou, Soren T. A1 - Simkins, Joanna A1 - Swaithes, Laura A1 - Thomas, Geraint A1 - Esch, Martin van der A1 - Whittaker, Jackie A1 - Zhang, Weiya T1 - Changing the narrative on osteoarthritis: A call for global action T2 - Osteoarthritis and Cartilage Y1 - 2024 U6 - https://doi.org/10.1016/j.joca.2024.02.004 SN - 1063-4584 VL - 32 IS - 4 SP - 414 EP - 420 ER - TY - GEN A1 - Lewerenz, Hans-Joachim A1 - Aggour, Mohammed A1 - Murrell, Chris A1 - Kanis, M. A1 - Jungblut, H. A1 - Jakubowicz, J. A1 - Cox, P. A. A1 - Campbell, S. A. A1 - Hoffmann, Patrick A1 - Schmeißer, Dieter T1 - Initial stages of structure formation on silicon electrodes investigated by photoelectron spectroscopy using synchrotron radiation and in-situ atomic force microscopy T2 - Journal of the Electrochemical Society N2 - The surface condition of electrochemically H-terminated Si is compared with the situation at the first photocurrent maximum in dilute acidic ammonium fluoride solution where the divalent dissolution converts into the four-valence process. The first high spectral-resolution photoelectron spectroscopy data using synchrotron radiation of electrochemically hydrogenated Si are presented. A combined electrochemistry/ultrahigh vacuum surface analysis system, attached to the U 49/2 beamline at the synchrotron Bessy II, is used for photoelectron spectroscopy (PES) of the electrochemically conditioned samples. We analyze the Si 2p, O 1s, and F 1s core levels. A comparison of a density functional theory calculation of the reaction sequence, proposed in the dissolution model of Gerischer and co-workers, with the PES results supports this model. The anodized sample is characterized by a residual H coverage of 0.35 monolayers evidenced by a surface core level shift, Si-OH and Si-Fx species, F-, and a higher oxidized Si species. SiO2 is not found. Even on very well H-terminated surfaces, we find residual Si-OH complexes, fluoride and water. In situ atomic force microscopy shows a roughening with a root mean square roughness parameter of 2.6 nm. %A92003 The Electrochemical Society. All rights reserved. Y1 - 2003 SN - 1945-7111 VL - 150 IS - 3 SP - E185 EP - E189 ER - TY - GEN A1 - Lewerenz, Hans-Joachim A1 - Murrell, Chris A1 - Jakubowicz, J. A1 - Aggour, Mohammed A1 - Kanis, M. A1 - Campbell, S. A. A1 - Cox, P. A. A1 - Hoffmann, Patrick A1 - Jungblut, H. A1 - Schmeißer, Dieter T1 - High Resolution Surface analysis of Si Roughenning in Dilute Ammonium Fluoride Solution T2 - Journal of Electroanalytical Chemistry N2 - The initial stages of porous Si formation on Si(111) in dilute ammonium fluoride solution are analysed by photoelectron spectroscopy using synchrotron radiation (SRPES). The PES results in the por-Si formation regime partly support a recent dissolution model. The contribution from the Si 2p surface core level shift shows that 0.35 ML of the surface is still H-terminated after interruption of the conditioning process at the first photocurrent maximum. Two signals shifted in binding energy by 0.8 and 1 eV, respectively, are attributed to reaction intermediates expected from the proposed reaction mechanism and from theoretical calculations using density functional theory (DFT). A distinct roughening is found in in-situ AFM measurements, with a calculated RMS roughness parameter of 2.6 nm. KW - Porous Si KW - transistors KW - Electropolishing KW - Photoelectron spectroscopy KW - AFM KW - Synchrotron radiation Y1 - 2003 SN - 1873-2569 VL - 540 SP - 3 EP - 6 ER - TY - GEN A1 - Aggour, Mohammed A1 - Stoerkel, Ulrich A1 - Murrell, Chris A1 - Campbell, S. A. A1 - Jungblut, H. A1 - Hoffmann, Patrick A1 - Mikalo, Ricardo Pablo A1 - Schmeißer, Dieter A1 - Lewerenz, Hans-Joachim T1 - Electrochemical interface modification of CuInS2 thin films N2 - We studied two novel electrochemical treatments of CuInS2 solar-cell absorber films, introduced to remove the deleterious segregated CuS phase. Their influence onsurface topography, chemistry and electronic properties was investigated using in situ atomic force microscopy (AFM) and photoclectron spectroscopy, performed inpart at the U49/2 undulator beam line at BESSY II. The results are examined in order to develop an improved understanding of the chemical-electrochemical surfacetransformation processes. KW - thin-film solar cells KW - copper indium disulfide KW - atomic force microscopy (AFM) KW - photoelectron spectroscopy KW - synchrotron radiation KW - Solar-Cell Y1 - 2002 ER -