TY - CHAP A1 - Rudolph, Matthias A1 - Dörner, Ralf T1 - Key Issues of Compact Models for GaAs Heterojunction Bipolar Transistors Y1 - 2004 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Meliani, Chafik A1 - Heinrich, Wolfgang T1 - On-Chip GaAs-HBT Broadband-Coupled High-Bitrate Modulator Driver TWAs Y1 - 2005 ER - TY - JOUR A1 - Rudolph, Matthias A1 - Beilenhoff, K. A1 - Dörner, Ralf A1 - Heymann, Peter T1 - Scalable GaInP/GaAs HBT Large-Signal Model Y1 - 2000 ER - TY - CHAP A1 - Lenk, Friedrich A1 - Dörner, Ralf A1 - Rumiantsev, Andrej A1 - Rudolph, Matthias T1 - Calibration Residual Error Propagation Analysis Using Conformal Mapping T2 - 77th ARFTG Microwave Measurement Conference (ARFTG 2011), Baltimore, Maryland, USA, 10 June 2011 Y1 - 2011 SN - 978-1-61284-959-1 PB - Piscataway, NJ CY - IEEE ER - TY - CHAP A1 - Rudolph, Matthias A1 - Engelmann, Jens A1 - Schmückle, Franz-Josef ED - Rudolph, Matthias ED - Root, David E. ED - Fager, Christian T1 - Large and packaged Transistors T2 - Nonlinear Transistor Model Parameter Extraction Techniques Y1 - 2011 SN - 978-0-521-76210-6 SP - 171 EP - 205 PB - Cambridge University Press CY - Cambridge ER - TY - CHAP A1 - Rudolph, Matthias A1 - Schnieder, Frank A1 - Schmückle, Franz-Josef A1 - Heinrich, Wolfgang T1 - An Analysis of Source Connections in GaN Power Transistor Packages T2 - Proceedings, Microwave Conference (GeMiC), 2012 The 7th in Ilmenau, Germany Y1 - 2012 SN - 978-3-9812668-4-9 CY - Ilmenau ER - TY - CHAP A1 - Rudolph, Matthias ED - Rudolph, Matthias ED - Fager, Christian ED - Root, David E. T1 - Introduction T2 - Nonlinear transistor model parameter extraction techniques Y1 - 2012 SN - 978-0-521-76210-6 SP - 1 EP - 17 PB - Cambridge University Press CY - Cambridge ER - TY - BOOK A1 - Rohde, Ulrich L. A1 - Rudolph, Matthias T1 - RF/Microwave Circuit Design for Wireless Applications Y1 - 2012 SN - 978-0-470-90181-6 PB - Wiley CY - Hoboken, NJ ET - 2. ed. ER - TY - CHAP A1 - Rudolph, Matthias A1 - Dörner, Ralf A1 - Ngnintedem, Eric A1 - Heinrich, Wolfgang T1 - Noise Modeling of GaN HEMT Devices T2 - Microwave Integrated Circuits Conference (EuMIC), 2012 7th European , Amsterdam Y1 - 2012 UR - http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6476772 SN - 978-1-4673-2302-4 SN - 978-2-87487-026-2 SP - 159 EP - 162 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andrei, Cristina A1 - Dörner, Ralf A1 - Bengtsson, Olof A1 - Chevtchenko, Serguei A. A1 - Heinrich, Wolfgang A1 - Rudolph, Matthias T1 - Highly Linear X-Band GaN-Based Low-Noise Amplifier T2 - Signals, Systems, and Electronics (ISSSE), 2012 International Symposium on , Potsdam Y1 - 2012 UR - http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6362332 SN - 978-1-4673-4454-8 SN - 978-1-4673-4453-1 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Schnieder, Frank A1 - Rudolph, Matthias T1 - Thermal Coupling in AlGaN/GaN Power Transistors T2 - Frequenz Y1 - 2013 U6 - https://doi.org/10.1515/freq-2012-0031 SN - 2191-6349 SN - 0016-1136 VL - 67 IS - 1-2 SP - 21 EP - 26 ER - TY - GEN A1 - Johansen, Tom K. A1 - Rudolph, Matthias A1 - Jensen, Thomas A1 - Kraemer, Tomas A1 - Weimann, Nils A1 - Schnieder, Frank A1 - Krozer, Viktor A1 - Heinrich, Wolfgang T1 - Modeling of InP HBTs in Transferred-Substrate Technology for Millimeter-Wave Applications T2 - Microwave Integrated Circuits Conference (EuMIC), 2013, 8th European, 6–8 October 2013 Nuremberg, Germany Y1 - 2013 SN - 978-2-87487-032-3 SP - 280 EP - 283 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Rudolph, Matthias A1 - Dörner, Ralf T1 - Towards a Large-Signal Noise Model for GaN HEMT Devices T2 - Microwave Integrated Circuits Conference (EuMIC), 2013, 8th European, 6–8 October 2013 Nuremberg, Germany Y1 - 2013 SP - 484 EP - 487 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Schnieder, Frank A1 - Bengtsson, Olof A1 - Schmückle, Franz-Josef A1 - Rudolph, Matthias A1 - Heinrich, Wolfgang T1 - Simulation of RF Power Distribution in a Packaged GaN Power Transistor Using an Electro-Thermal Large-Signal Description T2 - IEEE transactions on microwave theory and techniques Y1 - 2013 U6 - https://doi.org/10.1109/TMTT.2013.2261089 SN - 0018-9480 VL - 61 IS - 7 SP - 2603 EP - 2609 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Dörner, Ralf T1 - Bias-Dependent Pospieszalski Noise Model for GaN HEMT Devices T2 - GeMiC 2014, German Microwave Conference 2014, March 10 - 12, 2014, Aachen, Germany Y1 - 2014 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6775103&isnumber=6775099 SN - 978-3-8007-3585-3 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - GEN A1 - Johansen, Tom K. A1 - Rudolph, Matthias A1 - Jensen, Thomas A1 - Kraemer, Tomas A1 - Weimann, Nils A1 - Schnieder, Frank A1 - Krozer, Viktor A1 - Heinrich, Wolfgang T1 - Small- and large-signal modeling of InP HBTs in transferred-substrate technology T2 - International Journal of Microwave and Wireless Technologies Y1 - 2014 U6 - https://doi.org/10.1017/S1759078714000051 VL - 6 IS - 3-4 SP - 243 EP - 251 ER - TY - CHAP A1 - Koloska, Uwe A1 - Wolff, Matthias A1 - Rudolph, Torsten ED - Mehnert, Dieter T1 - Ein Werkzeug zur automatischen Inventargenerierung T2 - Elektronische Sprachsignalverarbeitung, Tagungsband der zehnten Konferenz, Görlitz, 20. bis 22. September 1999 Y1 - 1999 SN - 3-933592-64-X SP - 160 EP - 165 PB - w.e.b. Universitätsverlag CY - Dresden ER - TY - CHAP A1 - Rudolph, Matthias A1 - Escotte, Laurent A1 - Dörner, Ralf T1 - GaN HEMT Noise Model Performance under Nonlinear Operation T2 - Proceedings, 9th European Microwave Integrated Circuit Conference (EuMIC) Y1 - 2014 U6 - https://doi.org/10.1109/EuMIC.2014.6997895 SP - 472 EP - 475 PB - IEEE ER - TY - CHAP A1 - Rudolph, Matthias A1 - Escotte, Laurent A1 - Dörner, Ralf T1 - GaN HEMT Noise Model Performance under Nonlinear Operation T2 - Proceedings, 44th European Microwave Conference Y1 - 2014 SN - 978-2-87487-035-4 U6 - https://doi.org/10.1109/EuMC.2014.6986711 SP - 1416 EP - 1419 PB - IEEE ER - TY - GEN A1 - Apte, Anisha M. A1 - Poddar, Ajay K. A1 - Rudolph, Matthias A1 - Rohde, Ulrich L. T1 - A Novel Low Phase Noise X-Band Oscillator T2 - IEEE Microwave Magazine Y1 - 2015 U6 - https://doi.org/10.1109/MMM.2014.2367957 SN - 1527-3342 VL - 16 IS - 1 SP - 127 EP - 135 ER - TY - GEN A1 - Rudolph, Matthias A1 - Escotte, Laurent A1 - Dörner, Ralf T1 - Modeling Nonlinear White Noise in GaN HEMT Devices T2 - Frequenz Y1 - 2015 VL - 69 IS - 1-2 SP - 47 EP - 55 ER - TY - CHAP A1 - Andrei, Cristina A1 - Bengtsson, Olof A1 - Dörner, Ralf A1 - Chevtchenko, Serguei A. A1 - Heinrich, Wolfgang A1 - Rudolph, Matthias T1 - Dynamic behaviour of a Low-Noise Amplifier GaN MMIC under input power overdrive T2 - Proceedings of 45th European Microwave Conference, Paris 2015 Y1 - 2015 U6 - https://doi.org/10.1109/EuMC.2015.7345742 SP - 231 EP - 234 PB - IEEE ER - TY - GEN A1 - Nosaeva, Ksenia A1 - Weimann, Nils A1 - Rudolph, Matthias A1 - John, Wilfred A1 - Krüger, Olaf A1 - Heinrich, Wolfgang T1 - Improved thermal management of InP transistors in transferred-substrate technology with diamond heat-spreading layer T2 - Electronics Letters Y1 - 2015 U6 - https://doi.org/10.1049/el.2015.1135 SN - 1350-911X VL - 51 IS - 13 SP - 1010 EP - 1012 ER - TY - GEN A1 - Nosaeva, Ksenia A1 - Weimann, Nils A1 - Rudolph, Matthias A1 - John, Wilfred A1 - Krüger, Olaf A1 - Heinrich, Wolfgang T1 - Thin ice: Diamond films could more than double the power output achievable with transistors in the ‘Terahertz gap’ by improving thermal management T2 - Electronics Letters Y1 - 2015 U6 - https://doi.org/10.1049/el.2015.1943 SN - 1350-911X VL - 51 IS - 13 SP - S. 959 ER - TY - CHAP A1 - Andrei, Cristina A1 - Bengtsson, Olof A1 - Dörner, Ralf A1 - Chevtchenko, Serguei A. A1 - Rudolph, Matthias T1 - Robust Stacked GaN-Based Low-Noise Amplifier MMIC for Receiver Applications T2 - IEEE MTT-S International Microwave Symposium (IMS), 17-22 May 2015 Y1 - 2015 U6 - https://doi.org/10.1109/MWSYM.2015.7166766 PB - IEEE ER - TY - CHAP A1 - Luo, Peng A1 - Bengtsson, Olof A1 - Rudolph, Matthias T1 - Reliable GaN HEMT Modeling Based on Chalmers Model and Pulsed S-Parameter Measurements T2 - 2016 German Microwave Conference, March 14-16, 2016 Bochum, Germany Y1 - 2016 SN - 978-3-9812668-7-0 U6 - https://doi.org/10.1109/GEMIC.2016.7461650 SP - 441 EP - 444 PB - IEEE CY - Piscataway, NJ ER -