TY - GEN A1 - Liero, Armin A1 - Dewitz, Mike A1 - Kühn, Silvio A1 - Chaturvedi, Nidhi A1 - Xu, Jijun A1 - Rudolph, Matthias T1 - On the Recovery Time of Highly Robust Low-Noise Amplifiers T2 - IEEE transactions on microwave theory and techniques KW - Amplifier noise KW - integrated circuit noise KW - microwave field-effect transistor (FET) amplifiers KW - monolithic microwave integrated circuit (MMIC) amplifiers KW - noise KW - semiconductor device noise KW - integrated circuit (MMIC) amplifiers Y1 - 2010 U6 - https://doi.org/10.1109/TMTT.2010.2041519 SN - 0018-9480 VL - 58 IS - 4 SP - 781 EP - 787 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Andrei, Cristina A1 - Liero, Armin A1 - Lossy, Richard A1 - Heinrich, Wolfgang T1 - Highly Linear Broadband GaN-based Low-noise Amplifier Y1 - 2010 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Flucke, Jens A1 - Schnieder, Frank A1 - Schmückle, Franz-Josef A1 - Heinrich, Wolfgang T1 - On the magnetic coupling between bondwires in power-transistor packages Y1 - 2010 ER - TY - CHAP A1 - Rudolph, Matthias T1 - Modeling GaN Power Transistors Y1 - 2010 U6 - https://doi.org/http://dx.doi.org/10.1109/WAMICON.2010.5461846 ER - TY - CHAP A1 - Rudolph, Matthias T1 - Compact HBT modeling: status and challenges Y1 - 2010 U6 - https://doi.org/10.1109/MWSYM.2010.5517597 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Bengtsson, Olof A1 - Bent, G. van der A1 - Heinigen, M. van A1 - Vliet, F. F. van T1 - GaN-HEMT VSWR Ruggedness and Amplifier Protection Y1 - 2010 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Mostardinha, H. A1 - Cabral, P. M. A1 - Carvalho, N. B. A1 - Kurpas, Paul A1 - Würfl, Joachim A1 - Pinto, J. C. A1 - Barnes, J. A1 - Garat, F. T1 - GaN RF Oscillator Used in Space Applications Y1 - 2010 U6 - https://doi.org/http://dx.doi.org/10.1109/INMMIC.2010.5480142 ER - TY - CHAP A1 - Rudolph, Matthias A1 - Heinrich, Wolfgang T1 - Assessment of power-transistor package models: distributed versus lumped approach Y1 - 2010 ER - TY - GEN A1 - Rudolph, Matthias A1 - Heymann, Peter A1 - Boss, Hermann T1 - Impact of Receiver Bandwidth and Nonlinearity on Noise Measurement Methods Y1 - 2010 U6 - https://doi.org/http://dx.doi.org/10.1109/MMM.2010.937715 ER - TY - CHAP A1 - Rudolph, Matthias T1 - Noise modeling of GaAs HBTs N2 - Institutskolloquium, IHP Frankfurt (Oder), 2010 Y1 - 2010 ER - TY - CHAP A1 - Rudolph, Matthias T1 - Highly Robust GaN-Based Low-noise Amplifiers N2 - Institutskolloquium, TU Darmstadt, Fachgebiet Mikrowellentechnik, Darmstadt, 2010 Y1 - 2010 ER -