TY - GEN A1 - Varlamova, Olga A1 - Costache, Florenta Adriana A1 - Reif, Jürgen A1 - Bestehorn, Michael T1 - Self-organized pattern formation upon femtosecond laser ablation by circularly polarized light T2 - Applied Surface Science KW - femtosecond laser ablation KW - nanostructures KW - self-organization Y1 - 2006 SN - 0169-4332 VL - 252 IS - 13 SP - 4702 EP - 4706 ER - TY - GEN A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Eckert, Sebastian T1 - The role of energy and phase relaxation (T1 and T2) in ultrafast laser ablation KW - Femtosecond laser desorption KW - Time-of-flight mass spectrometry KW - Temporal dynamics Y1 - 2007 ER - TY - GEN A1 - Ratzke, Markus A1 - Wolfframm, Dirk A1 - Kappa, Mathias A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Pulsed laser deposition of HfO2 and Pr(x)O(y) high-k films on Si(100) T2 - Applied Surface Science Y1 - 2005 SN - 0169-4332 VL - 247 IS - 1-4 SP - 128 EP - 133 ER - TY - CHAP A1 - Costache, Florenta Adriana A1 - Eckert, Sebastian A1 - Reif, Jürgen T1 - On ultra-short laser pulse induced instabilities on the surface of non-metallic solids KW - Femtosecond laser KW - time-of-flight mass spectrometry KW - temporal dynamics KW - nanostructures Y1 - 2006 ER - TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana T1 - Self-organized surface nanostructuring by femtosecond laser processing KW - femtosecond laser ablation KW - nanostructures KW - self-organization Y1 - 2006 ER - TY - GEN A1 - Kappa, Mathias A1 - Ratzke, Markus A1 - Reif, Jürgen T1 - Pulsed laser deposition of hafnium oxide on silicon Y1 - 2005 ER - TY - JOUR A1 - Reif, Jürgen A1 - Schmid, Reiner P. A1 - Schneider, Thomas A1 - Wolfframm, Dirk T1 - Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress Y1 - 2000 ER - TY - CHAP A1 - Reif, Jürgen A1 - Schneider, Thomas A1 - Schmid, Reiner P. A1 - Wolfframm, Dirk ED - Helvajian, Henry T1 - Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress T2 - Laser Applications in Microelectronics and Optoelectronic Manufacturing V, 24 - 26 January 2000, San Jose, USA Y1 - 2000 SN - 0-8194-3550-3 PB - SPIE CY - Bellingham, Wash. ER - TY - CHAP A1 - Reif, Jürgen A1 - Schmid, Reiner P. T1 - Efficient instantaneous optical switching, frequency conversion and simple logic operations on a femtosecond time scale T2 - 25th International Congress on High-Speed Photography and Photonics, 29 September - 4 October 2002, Beaune, France Y1 - 2003 UR - http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=889727 SN - 0-8194-4744-7 U6 - https://doi.org/10.1117/12.516816 SP - 137 EP - 140 PB - SPIE CY - Bellingham, Wash. ER - TY - JOUR A1 - Schmeißer, Dieter A1 - Seibold, Götz A1 - Reif, Jürgen T1 - Nano-scaled Dielectric Barriers (NanoDieB) for CMOS compatible Si-technologies JF - Forum der Forschung KW - nano-scaled KW - dielectric KW - CMOS Y1 - 2006 SN - 0947-6989 IS - 19 SP - 131 EP - 136 ER -