TY - CHAP A1 - Frost, Raik A1 - Rudolph, D. A1 - Galke, Christian A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - A Configurable Modular Test Processor and Scan Controller Architecture T2 - Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007 KW - ICs KW - SoCs KW - Test KW - Selbsttest Y1 - 2007 SN - 0-7695-2918-6 N1 - IEEE Computer Society SP - 277 EP - 284 PB - IEEE CY - Piscataway, NJ ER -