TY - CHAP A1 - Vörtler, Thilo A1 - Rülke, Steffen A1 - Hofstedt, Petra T1 - Bounded Model Checking of Contiki Applications T2 - 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012 Y1 - 2012 SN - 978-1-4673-1187-8 SP - 258 EP - 261 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Rülke, Steffen A1 - Schneider, Jörg A1 - Bachmann, Peter A1 - Rogin, Frank T1 - Quality guaranty of reusable circuit description throught HDL-Source Code Analysis T2 - International Workshop on IP-Based Synthesis and System Design’99 Y1 - 1999 ER -