TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Perez, Eduardo A1 - Kabin, Ievgen A1 - Katzer, Jens A1 - Schäffner, Jan A1 - Langendörfer, Peter T1 - Sensitivity of HfO2-based RRAM Cells to Laser Irradiation T2 - Microprocessors and Microsystems Y1 - 2021 U6 - https://doi.org/10.1016/j.micpro.2021.104376 SN - 0141-9331 IS - 87 ER - TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Sorge, Roland A1 - Schaeffner, Jan A1 - Langendörfer, Peter T1 - Optical Fault Injection Attacks against Radiation-Hard Registers T2 - Proc. 24th EUROMICRO Conference on Digital System Design (DSD 2021), Special Session: Architectures and Hardware for Security Applications (AHSA), 371 Y1 - 2021 U6 - https://doi.org/10.48550/arXiv.2106.07271 ER - TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Perez, Eduardo A1 - Mahadevaiah, Mamathamba Kalishettyhalli A1 - Kabin, Ievgen A1 - Wenger, Christian A1 - Langendörfer, Peter T1 - Evaluation of the Sensitivity of RRAM Cells to Optical Fault Injection Attacks T2 - EUROMICRO Conference on Digital System Design (DSD 2020), Special Session: Architecture and Hardware for Security Applications (AHSA) Y1 - 2021 SN - 978-1-7281-9535-3 U6 - https://doi.org/10.1109/DSD51259.2020.00047 SN - 978-1-7281-9536-0 ER - TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Langendörfer, Peter T1 - Sensitivity of Standard Library Cells to Optical Fault Injection Attacks in IHP 250 nm Technology T2 - Mediterranean Conference on Embedded Computing (MECO 2020) Y1 - 2020 SN - 978-1-7281-6949-1 SN - 978-1-7281-6947-7 U6 - https://doi.org/10.1109/MECO49872.2020.9134146 SN - 2637-9511 ER - TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Langendörfer, Peter T1 - Optical Fault Injection Attacks: Single-Mode versus Multi-Mode Laser T2 - Proc. 33rd Crypto-Day Matters 2021, (2021) Y1 - 2021 U6 - https://doi.org/10.18420/cdm-2021-33-23 ER - TY - GEN A1 - Petryk, Dmytro A1 - Dyka, Zoya A1 - Langendörfer, Peter T1 - Laser Fault Injection Attacks against IHP Chips T2 - Proc. 32. Crypto-Day Matters 2021, (2021) Y1 - 2021 U6 - https://doi.org/10.18420/cdm-2021-32-22 ER -