TY - CHAP A1 - Simevski, Aleksandar A1 - Schleisiek, Klaus A1 - Petrovic, Vladimir A1 - Beller, Norbert A1 - Skoncej, Patryk A1 - Schoof, Gunther A1 - Krstic, Milos T1 - Implementation of a Real Time Unit for Satellite Applications T2 - 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 20-22 April 2016, Kosice, Slovakia Y1 - 2016 SN - 978-1-5090-2467-4 SP - 180 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Skoncej, Patryk A1 - Mühlbauer, Felix A1 - Kubicek, Felix A1 - Schröder, Lukas A1 - Schölzel, Mario T1 - Feasibility of Software-based Repair for Program Memories T2 - 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Sant Feliu de Guixols, Spain, 2016 Y1 - 2016 SN - 978-1-5090-1507-8 SP - 199 EP - 202 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means T2 - IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM) Y1 - 2015 SN - 978-1-4799-6972-2 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - Software-based Repair for Memories in Tiny Embedded Systems T2 - 20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015 Y1 - 2015 SN - 978-1-4799-7603-4 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Skoncej, Patryk A1 - Mühlbauer, Felix A1 - Schölzel, Mario ED - Cunningham, Douglas William ED - Hofstedt, Petra ED - Meer, Klaus ED - Schmitt, Ingo T1 - Softwarebasierte Selbstreparatur von Flash-Speichern für fehlertolerante mikrocontroller-basierte Systeme T2 - Informatik 2015, Tagung vom 28. September – 2. Oktober 2015 in Cottbus Y1 - 2015 SN - 978-3-88579-640-4 SP - 1461 EP - 1473 PB - Gesellschaft für Informatik e.V. CY - Bonn ER - TY - CHAP A1 - Skoncej, Patryk T1 - Protecting Flash Memory Areas Against Memory Faults in Tiny Embedded Systems T2 - 15th Biennial Baltic Electronics Conference (BEC), 3-5 Oct. 2016, Tallinn, Estonia Y1 - 2016 SN - 978-1-5090-1393-7 SP - 91 EP - 94 PB - IEEE CY - Piscataway, NJ ER -