TY - GEN A1 - Das, Chittaranjan A1 - Zia, Waqas A1 - Mortan, Claudiu A1 - Hussain, Navid A1 - Saliba, Michael A1 - Flege, Jan Ingo A1 - Kot, Małgorzata T1 - Top-Down Approach to Study Chemical and Electronic Properties of Perovskite Solar Cells: Sputtered Depth Profiling Versus Tapered Cross-Sectional Photoelectron Spectroscopies T2 - Solar RRL N2 - A study of the chemical and electronic properties of various layers across perovskite solar cell (PSC) stacks is challenging. Depth-profiling photoemission spectroscopy can be used to study the surface, interface, and bulk properties of different layers in PSCs, which influence the overall performance of these devices. Herein, sputter depth profiling (SDP) and tapered cross-sectional (TCS) photoelectron spectroscopies (PESs) are used to study highly efficient mixed halide PSCs. It is found that the most used SDP-PES technique degrades the organic and deforms the inorganic materials during sputtering of the PSCs while the TCS-PES method is less destructive and can determine the chemical and electronic properties of all layers precisely. The SDP-PES dissociates the chemical bonding in the spiro-MeOTAD and perovskite layer and reduces the TiO2, which causes the chemical analysis to be unreliable. The TCS-PES revealed a band bending only at the spiro-MeOTAD/perovskite interface of about 0.7 eV. Both the TCS and SDP-PES show that the perovskite layer is inhomogeneous and has a higher amount of bromine at the perovskite/TiO2 interface. KW - chemical distributions KW - depth profiles KW - interfaces KW - perovskite solar cells KW - X-ray photoelectron spectroscopy Y1 - 2021 U6 - https://doi.org/10.1002/solr.202100298 SN - 2367-198X VL - 5 IS - 10 ER - TY - GEN A1 - Das, Chittaranjan A1 - Kedia, Mayank A1 - Zuo, Weiwei A1 - Mortan, Claudiu A1 - Kot, Małgorzata A1 - Flege, Jan Ingo A1 - Saliba, Michael T1 - Band Bending at Hole Transporting Layer-Perovskite Interfaces in n-i-p and in p-i-n Architecture T2 - Solar RRL N2 - Interfaces between hybrid perovskite absorber and its adjacent charge-transporting layers are of high importance for solar cells performance. Understanding their chemical and electronic properties is a key step in designing efficient and stable perovskite solar cells. In this work, the tapered cross-section photoemission spectroscopy (TCS-PES) method is used to study the methylammonium lead iodide (CH3NH3PbI3) (MAPI)-based solar cells in two configurations, that is, in an inverted p–i–n and in a classical n–i–p architecture. It is revealed in the results that the MAPI film deposited once on the n-type TiO2 and once on the p-type NiOx substrates is neither an intrinsic semiconductor nor adapts to the dopant nature of the substrate underneath, but it is heavily n-type doped on both substrates. In addition to that, the TCS-PES results identify that the band bending between the MAPI film and the hole transporting layer (HTL) layer depends on the perovskite solar cells architecture. In particular, a band bending on the HTL side in the n–i–p and at the MAPI in the p–i–n architecture is found. The flat band of NiOx at the NiOx/MAPI interface can be explained by the Fermi level pinning of the NiOx at the interface. KW - band bending KW - hole transporting layer KW - perovskites KW - X-ray photoelectron spectroscopy (XPS) Y1 - 2022 U6 - https://doi.org/10.1002/solr.202200348 SN - 2367-198X VL - 6 IS - 9 ER -