TY - CHAP A1 - Andjelkovic, Marko A1 - Babic, Milan A1 - Li, Yuanqing A1 - Schrape, Oliver A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates T2 - 25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018 Y1 - 2018 SN - 978-1-5386-9562-3 SN - 978-1-5386-9116-8 U6 - https://doi.org/10.1109/ICECS.2018.8617996 SP - 361 EP - 364 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro Y1 - 2017 SP - S. 184 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic T2 - IEEE East-West Design & Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018 Y1 - 2018 SN - 978-1-5386-5709-6 U6 - https://doi.org/10.1109/EWDTS.2018.8524748 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Nenadovic, Miljana A1 - Petrovic, Vladimir A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017 Y1 - 2017 UR - http://rad2017.rad-conference.org/news.php SP - S. 214 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190106 SP - 217 EP - 220 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation T2 - 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017 Y1 - 2017 SN - 978-1-5386-0352-9 PB - IEEE CY - Piscataway, NJ ER -