TY - CHAP A1 - Krstic, Milos A1 - Fan, Xin A1 - Babic, Milan A1 - Grass, Eckhard A1 - Bjerregaard, T. A1 - Yakovlev, A. T1 - Reducing Switching Noise Effects by Advanced Clock Management T2 - 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 4-8 July, St. Petersburg, Russia 2017 Y1 - 2017 SN - 978-1-5386-2689-4 SP - 3 EP - 8 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf A1 - Veeravalli, Varadan Savulimedu A1 - Steininger, Andreas T1 - Erstellung eines Modells der kritischen Ladung zur Bewertung der Robustheit gegenüber SETs und SEUs: Fallstudie Muller C-Element T2 - Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus Y1 - 2017 SN - 978-3-8007-4444-2 SP - 17 EP - 24 PB - Berlin CY - VDE Verlag ER - TY - CHAP A1 - Troya Chinchilla, Alfonso Luis A1 - Maharatna, Koushik A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Kraemer, Rolf T1 - OFDM Synchronizer Implementation for an IEEE 802.11a Compliant Modem Y1 - 2002 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Jagdhold, Ulrich A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - 2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology T2 - Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus Y1 - 2017 SN - 978-3-8007-4444-2 SP - 90 EP - 96 PB - Berlin CY - VDE Verlag ER - TY - CHAP A1 - Maharatna, Koushik A1 - Troya Chinchilla, Alfonso Luis A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Jagdhold, Ulrich T1 - A CORDIC Like Processor for Computation of Arctangent and Absolute Magnitude of a Vector Y1 - 2004 ER - TY - GEN A1 - Perez-Bosch Quesada, Emilio A1 - Mahadevaiah, Mamathamba Kalishettyhalli A1 - Rizzi, Tommaso A1 - Wen, Jianan A1 - Ulbricht, Markus A1 - Krstic, Milos A1 - Wenger, Christian A1 - Perez, Eduardo T1 - Experimental Assessment of Multilevel RRAM-based Vector-Matrix Multiplication Operations for In-Memory Computing T2 - IEEE Transactions on Electron Devices N2 - Resistive random access memory (RRAM)-based hardware accelerators are playing an important role in the implementation of in-memory computing (IMC) systems for artificial intelligence applications. The latter heavily rely on vector-matrix multiplication (VMM) operations that can be efficiently boosted by RRAM devices. However, the stochastic nature of the RRAM technology is still challenging real hardware implementations. To study the accuracy degradation of consecutive VMM operations, in this work we programed two RRAM subarrays composed of 8x8 one-transistor-one-resistor (1T1R) cells following two different distributions of conductive levels. We analyze their robustness against 1000 identical consecutive VMM operations and monitor the inherent devices’ nonidealities along the test. We finally quantize the accuracy loss of the operations in the digital domain and consider the trade-offs between linearly distributing the resistive states of the RRAM cells and their robustness against nonidealities for future implementation of IMC hardware systems. KW - RRAM KW - Vector Matrix Multiplication KW - variability Y1 - 2023 U6 - https://doi.org/10.1109/TED.2023.3244509 SN - 0018-9383 VL - 70 IS - 4 SP - 2009 EP - 2014 ER - TY - CHAP A1 - Simevski, Aleksandar A1 - Kraemer, Rolf A1 - Krstic, Milos T1 - Low-Complexity Integrated Circuit Aging Monitor Y1 - 2011 ER - TY - CHAP A1 - Schrape, Oliver A1 - Krstic, Milos A1 - Philipp, Gunnar A1 - Winkler, Frank T1 - A Digital Design Flow for Differential ECL High Speed Applications Y1 - 2011 ER - TY - CHAP A1 - Krstic, Milos A1 - Fan, X. A1 - Grass, Eckhard A1 - Strano, A. A1 - Bertozzi, Davide A1 - Heer, Ch. A1 - Sanders, B. A1 - Benini, L. A1 - Kakooe, M. R. T1 - Moonrake Chip - GALS Demonstrator in 40 nm CMOS Technology Y1 - 2011 ER - TY - CHAP A1 - Fan, X. A1 - Krstic, Milos A1 - Wolf, Ch. A1 - Grass, Eckhard T1 - GALS Design for On-Chip Ground Bounce Suppression Y1 - 2011 ER - TY - CHAP A1 - Grass, Eckhard A1 - Winkler, F. A1 - Krstic, Milos A1 - Julius, A. A1 - Stahl, C. A1 - Piz, M. T1 - Enhanced GALS Techniques for Datapath Applications Y1 - 2005 ER - TY - CHAP A1 - Maharatna, Koushik A1 - Troya Chinchilla, Alfonso Luis A1 - Krstic, Milos A1 - Grass, Eckhard T1 - On the Implementation of a Low-Power IEEE 802.11a Compliant Viterbi Decoder Y1 - 2006 ER - TY - CHAP A1 - Grass, Eckhard A1 - Herzel, F. A1 - Piz, M. A1 - Schmalz, K. A1 - Sun, Yaoming A1 - Glisic, S. A1 - Krstic, Milos A1 - Tittelbach-Helmrich, Klaus A1 - Ehrig, Marcus A1 - Winkler, W. A1 - Scheytt, J. Christoph A1 - Kraemer, Rolf T1 - 60 GHz SiGe-BiCMOS Radio for OFDM Transmission Y1 - 2007 ER - TY - CHAP A1 - Piz, M. A1 - Krstic, Milos A1 - Ehrig, Marcus A1 - Grass, Eckhard T1 - An OFDM Baseband Receiver for Short-Range Communication at 60 GHz Y1 - 2009 ER - TY - GEN A1 - Andjelkovic, Marko A1 - Chen, Junchao A1 - Simevski, Aleksandar A1 - Stamenkovic, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - A Review of Particle Detectors for Space-Borne Self-Adaptive Fault Tolerant Systems T2 - 18th IEEE East-West Design and Test Symposium (EWDTS 2020), Varna, Bulgaria, 04 - 07 September 2020 Y1 - 2020 SN - 978-1-7281-9899-6 SN - 978-1-7281-9898-9 SN - 978-1-7281-9900-9 U6 - https://doi.org/10.1109/EWDTS50664.2020.9225138 SN - 2472-761X PB - IEEE ER - TY - PAT A1 - Grass, Eckhard A1 - Krstic, Milos A1 - Winkler, F. T1 - GALS-Schaltung und Verfahren zum Betrieb einer GALS-Schaltung Y1 - 2005 ER - TY - GEN A1 - Andjelkovic, Marko A1 - Li, Yuanqing A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodos, Greece, 01 - 03 July 2019 Y1 - 2019 SN - 978-1-7281-2490-2 SN - 978-1-7281-2489-6 SN - 978-1-7281-2491-9 U6 - https://doi.org/10.1109/IOLTS.2019.8854379 SN - 1942-9401 PB - IEEE ER - TY - GEN A1 - Veleski, Mitko A1 - Kraemer, Rolf A1 - Krstic, Milos T1 - SWIELD: An In Situ Approach for Adaptive Low Power and Error-Resilient Operation T2 - 17th IEEE East-West Design & Test Symposium (EWDTS 2019), Batumi, Georgia, 13 - 16 September 2019 Y1 - 2019 SN - 978-1-7281-1003-5 SN - 978-1-7281-1002-8 SN - 978-1-7281-1004-2 U6 - https://doi.org/10.1109/EWDTS.2019.8884428 SN - 2472-761X PB - IEEE ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf A1 - Veeravalli, Varadan Savulimedu A1 - Steininger, Andreas T1 - A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study T2 - IEEE 26th Asian Test Symposium (ATS), Taipei, Taiwan, 28-30 November 2017 Y1 - 2017 SN - 978-1-5386-2437-1 U6 - https://doi.org/10.1109/ATS.2017.27 SP - 78 EP - 83 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Veleski, Mitko A1 - Hübner, Michael A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Design and implementation strategy of adaptive processor-based systems for error resilient and power-efficient operation T2 - 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS, April 7-9 2021 Y1 - 2021 SN - 978-1-6654-3595-6 U6 - https://doi.org/10.1109/DDECS52668.2021.9417023 SP - 57 EP - 62 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Veleski, Mitko A1 - Hübner, Michael A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Towards Error Resilient and Power-Efficient Adaptive Multiprocessor System using Highly Configurable and Flexible Cross-Layer Framework T2 - IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), IOLTS 2021, June 28-30, 2021 Y1 - 2021 SN - 978-1-6654-3370-9 U6 - https://doi.org/10.1109/IOLTS52814.2021.9486695 SP - 1 EP - 7 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Krstic, Milos A1 - Stojčev, M. K. A1 - Djordjevic, Goran L. A1 - Andrejic, I. D. T1 - A Mid Value-Select Voter T2 - Microelectronics Reliability Y1 - 2005 U6 - https://doi.org/10.1016/j.microrel.2004.07.006 SN - 0026-2714 VL - 45 IS - 3/4 SP - 733 EP - 738 ER - TY - GEN A1 - Nikolic, Tatjana A1 - Djordjevic, Goran L. A1 - Krstic, Milos A1 - Stojcev, M. T1 - Data Transfers over Peripheral Bus Using CDMA Technique Y1 - 2011 ER - TY - JOUR A1 - Krstic, Milos A1 - Maharatna, Koushik A1 - Troya Chinchilla, Alfonso Luis A1 - Grass, Eckhard A1 - Jagdhold, Ulrich T1 - Baseband Processor for IEEE 802.11a Standard with embedded BIST Y1 - 2004 ER - TY - JOUR A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Stahl, C. A1 - Piz, M. T1 - System Integration by Request-driven GALS Design Y1 - 2006 ER - TY - JOUR A1 - Troya Chinchilla, Alfonso Luis A1 - Maharatna, Koushik A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Jagdhold, Ulrich A1 - Kraemer, Rolf T1 - Efficient Inner Receiver Design for OFDM-Based WLAN Systems: Algorithm and Architecture Y1 - 2007 ER - TY - JOUR A1 - Troya Chinchilla, Alfonso Luis A1 - Maharatna, Koushik A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Jagdhold, Ulrich A1 - Kraemer, Rolf T1 - Low-Power VLSI Implementation of the Inner Receiver for OFDM-Based WLAN Systems Y1 - 2008 ER - TY - JOUR A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Gürkaynak, F. A1 - Vivet, P. T1 - Globally Asynchronous, Locally Synchronous Circuits: Overview & Outlook Y1 - 2007 ER - TY - JOUR A1 - Krstic, Milos A1 - Grass, Eckhard A1 - Heer, Ch. T1 - A GALS Approach to Improve System Integration Y1 - 2008 ER - TY - BOOK A1 - Fan, X. A1 - Krstic, Milos A1 - Grass, Eckhard T1 - Improvements in Pausible Clocking Scheme for High-Throughput and High-Reliability GALS Systems Design Y1 - 2010 PB - Springer ER - TY - PAT A1 - Stamenković, Zoran A1 - Kraemer, Rolf A1 - Krstic, Milos A1 - Tittelbach-Helmrich, Klaus A1 - Ignacio, S. A1 - Javier, V. A1 - Jesus, P. A1 - Jesus, I. T1 - MIMO Transmission in IEEE 802.11 WLAN Systems Y1 - 2009 ER - TY - PAT A1 - Krstic, Milos A1 - Fan, X. A1 - Grass, Eckhard T1 - GALS Circuit Block and GALS Circuit Device Suitable for Bursty Data Transfer Y1 - 2009 ER - TY - PAT A1 - Fan, X. A1 - Grass, Eckhard A1 - Krstic, Milos T1 - Aussetzbarer Taktgenerator Y1 - 2009 ER - TY - PAT A1 - Krstic, Milos A1 - Fan, X. A1 - Grass, Eckhard T1 - GALS Circuit Block and GALS Circuit Device Suitable for Bursty Data Transfer Y1 - 2008 ER - TY - THES A1 - Krstic, Milos T1 - Request-driven GALS technique for datapath architectures KW - Gals KW - System integration KW - Asynchroner Entwurf KW - EMI KW - BIST Y1 - 2006 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-000000888 ER - TY - PAT A1 - Grass, Eckhard A1 - Krstic, Milos T1 - Asynchrone Hüllschaltung für eine global asynchrone, lokale synchrone (GALS) Schaltung Y1 - 2006 ER - TY - RPRT A1 - Tittelbach-Helmrich, Klaus A1 - Krstic, Milos A1 - Fiebig, Norbert A1 - Methfessel, Michael T1 - Test Report for WLAN Access Point Chipset, Deliverable D5.2 Y1 - 2005 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Modeling and Simulation of the Single Event Transients at the Circuit Level T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190065 SP - 35 EP - 44 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Analysis of the Operation and SET Robustness of a CMOS Pulse Stretching Circuit T2 - 20thInternational Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2017), 19-21 April 2017 Dresden Y1 - 2017 SN - 978-1-5386-0472-4 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Petrovic, Vladimir A1 - Nenadovic, Miljana A1 - Breitenreiter, Anselm A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Design of an On-Chip System for the SET Pulse Width Measurement T2 - Euromicro Conference on Digital System Design, 30 Aug.-1 Sept., Vienna, Austria 2017 Y1 - 2017 SN - 978-1-5386-2146-2 SP - 111 EP - 118 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Babic, Milan A1 - Li, Yuanqing A1 - Schrape, Oliver A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates T2 - 25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018 Y1 - 2018 SN - 978-1-5386-9562-3 SN - 978-1-5386-9116-8 U6 - https://doi.org/10.1109/ICECS.2018.8617996 SP - 361 EP - 364 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Ilic, Aleksandar A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - An Overview of the Current Models for the Circuit-level Simulations of Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), June 12-16, 2017, Budva, Montenegro Y1 - 2017 SP - S. 184 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Stamenković, Zoran A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Impact of Resistive Open and Bridge Defects on the SET Robustness of CMOS Combinational Logic T2 - IEEE East-West Design & Test Symposium (EWDTS 2018), Kazan, Russia, 14 - 17 September 2018 Y1 - 2018 SN - 978-1-5386-5709-6 U6 - https://doi.org/10.1109/EWDTS.2018.8524748 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Nenadovic, Miljana A1 - Petrovic, Vladimir A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Evaluation of the Pulse Stretcher for Detection of Very Short Single Event Transients T2 - Book of abstracts, 5th International Conference on Radiation and Applications in Various Fields of Research (RAD 2017), Budva, Montenegro, 2017 Y1 - 2017 UR - http://rad2017.rad-conference.org/news.php SP - S. 214 ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology T2 - 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia Y1 - 2017 SN - 978-1-5386-2563-7 SN - 978-1-5386-2561-3 U6 - https://doi.org/10.1109/MIEL.2017.8190106 SP - 217 EP - 220 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Andjelkovic, Marko A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Assessment of the Amplitude-duration Criterion for SET Robusness Evaluation T2 - 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece, 3-5 July 2017 Y1 - 2017 SN - 978-1-5386-0352-9 PB - IEEE CY - Piscataway, NJ ER -