TY - CHAP A1 - Andjelkovic, Marko A1 - Babic, Milan A1 - Li, Yuanqing A1 - Schrape, Oliver A1 - Krstic, Milos A1 - Kraemer, Rolf T1 - Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates T2 - 25th IEEE International Conference on Electronics Circuits and Systems (ICECS 2018), Bordeaux, France, 09 - 12 December 2018 Y1 - 2018 SN - 978-1-5386-9562-3 SN - 978-1-5386-9116-8 U6 - https://doi.org/10.1109/ICECS.2018.8617996 SP - 361 EP - 364 PB - IEEE CY - Piscataway, NJ ER -