TY - GEN A1 - Rao, Megha Krishnaji A1 - Wentzel, Andreas A1 - Hoffmann, Thomas A1 - Schellhase, Lars A1 - Chevtchenko, Serguei A. A1 - Rudolph, Matthias T1 - Digital GaN-based transceiver module for future green 5G networks T2 - 2024 54th European Microwave Conference (EuMC) Y1 - 2024 U6 - https://doi.org/10.23919/EuMC61614.2024.10732423 SP - 136 EP - 139 PB - IEEE ER - TY - GEN A1 - Manchanda, Prabhav A1 - Andrei, Cristina A1 - Tost, Frank A1 - Rudolph, Matthias T1 - A pHEMT based power detector for radar applications T2 - 2024 54th European Microwave Conference (EuMC) Y1 - 2024 U6 - https://doi.org/10.23919/EuMC61614.2024.10732043 SP - 992 EP - 995 PB - IEEE ER - TY - GEN A1 - Haque, Sanaul A1 - Andrei, Cristina A1 - Wolf, Mihaela A1 - Hilt, Oliver A1 - Rudolph, Matthias T1 - Switch integrated Ka-Band low noise amplifier in GaN/AlN HEMT technology T2 - 2024 19th European Microwave Integrated Circuits Conference (EuMIC) Y1 - 2024 U6 - https://doi.org/10.23919/EuMIC61603.2024.10732731 SP - 351 EP - 354 PB - IEEE ER - TY - GEN A1 - Zervos, Christos A1 - Beleniotis, Petros A1 - Rudolph, Matthias T1 - A computational analysis of the impact of thin undoped channels in surface-related current collapse of AlGaN/GaN HEMTs T2 - Semiconductor Science and Technology N2 - Abstract This study provides an insight into the impact of thin purely undoped GaN channel thickness (t ch) on surface-related trapping effects in AlGaN/GaN high electron mobility transistors. Our TCAD study suggests that in cases where parasitic gate leakage is the driving trapping mechanism that promotes the injection of electrons from the Schottky gate contact into surface states, this effect can be alleviated by reducing t ch of the undoped GaN channel. We show that by decreasing t ch from 130 to 10 nm, devices exhibit a reduction in gate-related current collapse under the specific class-B RF operating bias conditions as a consequence of a substantial decrease in the off-state gate leakage with reducing t ch. Large-signal simulations revealed an increase by 3 W mm−1 and about 12% output power and power-added efficiency due to the decrease of gate-related collapse. This work, for the first time, highlights the role of a proper purely undoped GaN t ch selection to alleviate gate-related surface trapping in the design of GaN-based microwave power amplifiers. Y1 - 2024 U6 - https://doi.org/10.1088/1361-6641/ad689c SN - 0268-1242 VL - 39 IS - 9 SP - 1 EP - 8 PB - IOP Publishing ER - TY - GEN A1 - Beleniotis, Petros A1 - Krause, Sascha A1 - Zervos, Christos A1 - Rudolph, Matthias T1 - A Physics-Based Model for Slow Gate-Induced Electron Trapping in GaN HEMTs T2 - IEEE Transactions on Electron Devices Y1 - 2024 U6 - https://doi.org/10.1109/TED.2024.3397234 SN - 0018-9383 VL - 71 IS - 7 SP - 4058 EP - 4065 PB - Institute of Electrical and Electronics Engineers (IEEE) ER - TY - GEN A1 - Beleniotis, Petros A1 - Zervos, Christos A1 - Krause, Sascha A1 - Chevtchenko, Serguei A1 - Ritter, Dan A1 - Rudolph, Matthias T1 - Investigation of traps impact on PAE and linearity of AlGaN/GaN HEMTs relying on a combined TCAD–compact model approach T2 - IEEE Transactions on Electron Devices Y1 - 2024 U6 - https://doi.org/10.1109/TED.2024.3388386 SN - 0018-9383 VL - 71 (2024) IS - 6 SP - 3582 EP - 3589 PB - Institute of Electrical and Electronics Engineers (IEEE) ER - TY - GEN A1 - Yazdani, Hossein A1 - Zervos, Christos A1 - Beleniotis, Petros A1 - Brusaterra, Enrico A1 - Hilt, Oliver A1 - Rudolph, Matthias A1 - Würfl, Joachim T1 - Importance of Scaling in RF GaN HEMTs for Reduction of Surface Traps‐Induced Drain Lag T2 - Physica Status Solidi (a) N2 - Drain lag is a well‐known phenomenon that leads to radio frequency performance degradation in AlGaN/GaN high‐electron‐mobility transistors. Herein, it is demonstrated that a reduction of the gate‐to‐drain distance (Lgd) from 2.0 to 0.5 μm results in 7% reduction in the current collapse. This improvement is attributed to a decrease in surface trapping, which, in this case, is found to have a greater impact on current collapse than relatively slow traps in the buffer layer. To support this argument, TCAD simulations are conducted. Load‐pull analysis confirms that scaling the devices to Lgd = 0.5 μm provides 15% better output power density at 10 GHz than Lgd = 2.0 μm. Additionally, a new passivation layer for reduced surface traps exhibits a 20 to 30% higher output power density and at least a 10% improvement in power‐added efficiency at 20 GHz on a nominally identical GaN‐on‐semi‐insulating SiC epi‐wafer. Y1 - 2024 U6 - https://doi.org/10.1002/pssa.202300885 SN - 1862-6300 SP - 1 EP - 8 PB - Wiley ER - TY - GEN A1 - Rudolph, Matthias A1 - Beleniotis, Petros A1 - Zervos, Christos A1 - Rohde, Ulrich L. A1 - Andrei, Cristina T1 - Determining GaN HEMT trap models from MHz load-line measurement : a case study T2 - 2024 15th German Microwave Conference (GeMiC) Y1 - 2024 U6 - https://doi.org/10.23919/GeMiC59120.2024.10485297 SP - 29 EP - 32 PB - IEEE ER - TY - GEN A1 - Kaule, Evelyne A1 - Luo, Peng A1 - Chevtchenko, Serguei A. A1 - Andrei, Cristina A1 - Rudolph, Matthias T1 - Analysis for the optimization of a rugged GaN low-noise amplifier MMIC with a compact stacked first amplifier stage T2 - 2024 IEEE International Conference on Microwaves, Communications, Antennas, Biomedical Engineering and Electronic Systems (COMCAS) Y1 - 2024 U6 - https://doi.org/10.1109/COMCAS58210.2024.10666226 SP - 1 EP - 4 PB - IEEE ER - TY - GEN A1 - Haque, Sanaul A1 - Beleniotis, Petros A1 - Yazdani, Hossein A1 - Rudolph, Matthias T1 - Ka-Band GaN power amplifier with integrated DC supply switch and RF switch T2 - 2024 25th International Microwave and Radar Conference (MIKON) Y1 - 2024 U6 - https://doi.org/10.23919/MIKON60251.2024.10633971 SP - 1 EP - 5 PB - IEEE ER - TY - CHAP A1 - Naumann, Matthias A1 - Rudolph, David T1 - Ländliche Utopien als infrastrukturelle Utopien : Progressive Alternativen zu infrastruktureller Peripherisierung und infrastrukturellem Populismus. T2 - Ländliche Utopien : Herausforderungen und Alternativen regionaler Entwicklungen. Y1 - 2024 SN - 978-3-8394-7233-0 U6 - https://doi.org/10.1515/9783839472330 SP - 115 EP - 126 PB - Transcript Verlag CY - Bielefeld ER - TY - GEN A1 - Kaule, Evelyne A1 - Yazdani, Hossein A1 - Rudolph, Matthias T1 - Highly Linear Concurrent Tri-Band GaN LNA MMIC for 0.8/1.8/3.6 GHz Applications T2 - 24th International Microwave and Radar Conference (MIKON) Y1 - 2022 SN - 978-83-956020-3-0 SN - 978-1-6654-1106-6 U6 - https://doi.org/10.23919/Mikon54314.2022.9924770 ER - TY - GEN A1 - Manchanda, Prabhav A1 - Okocha, Jonathan A1 - Rudolph, Matthias T1 - Improved Sensitivity of Zero Bias Diode Power Detectors using Impedance Tuners T2 - IEEE Microwaves, Antennas, and Propagation Conference (MAPCON) Y1 - 2022 SN - 978-1-6654-5203-8 SN - 978-1-6654-5204-5 U6 - https://doi.org/10.1109/MAPCON56011.2022.10047233 SP - 1261 EP - 1266 ER - TY - GEN A1 - Rao, Megha Krishnaji A1 - Dörner, Ralf A1 - Yazdani, Hossein A1 - Rudolph, Matthias T1 - GaN-HEMT Based Common-Gate LNA MMIC with Integrated Switch for Compact 5G Transceivers T2 - IEEE Microwaves, Antennas, and Propagation Conference (MAPCON) Y1 - 2022 SN - 978-1-6654-5203-8 SN - 978-1-6654-5204-5 U6 - https://doi.org/10.1109/MAPCON56011.2022.10047410 SP - 1104 EP - 1107 ER - TY - GEN A1 - Sriperumbuduri, Venkata Pawan A1 - Wenzel, Andreas A1 - Rudolph, Matthias T1 - Mathematical Analysis of Switching HBT Devices T2 - IEEE Microwaves, Antennas, and Propagation Conference (MAPCON), 12-16 December 2022, Bangalore, India Y1 - 2022 SN - 978-1-6654-5203-8 SN - 978-1-6654-5204-5 U6 - https://doi.org/10.1109/MAPCON56011.2022.10047449 SP - 827 EP - 831 ER - TY - GEN A1 - Beleniotis, Petros A1 - Schnieder, Frank A1 - Chevtchenko, Serguei A. A1 - Rudolph, Matthias T1 - Localization of Trapping Effects in GaN HEMTs with Pulsed S-parameters and Compact Models T2 - 17th European Microwave Integrated Circuits Conference (EuMIC) Y1 - 2022 SN - 978-2-87487-070-5 SN - 978-1-6654-5880-1 U6 - https://doi.org/10.23919/EuMIC54520.2022.9923511 SP - 149 EP - 152 ER - TY - GEN A1 - Huynh, Dang Khoa A1 - Le, Quang Huy A1 - Lehmann, Steffen A1 - Zhao, Zhixing A1 - Bossu, Germain A1 - Arfaoui, Wafa A1 - Kämpfe, Thomas A1 - Rudolph, Matthias T1 - Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation T2 - 18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin Y1 - 2023 SN - 978-2-87487-073-6 SN - 979-8-3503-4833-0 U6 - https://doi.org/10.23919/EuMIC58042.2023.10288886 SP - 173 EP - 176 ER - TY - GEN A1 - Zervos, Christos A1 - Beleniotis, Petros A1 - Krause, Sascha A1 - Ritter, Dan A1 - Rudolph, Matthias T1 - The role of gate leakage on surface-related current collapse in AlGaN/GaN HEMTs T2 - 18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin Y1 - 2023 SN - 978-2-87487-073-6 SN - 979-8-3503-4833-0 U6 - https://doi.org/10.23919/EuMIC58042.2023.10289036 VL - 2023 SP - 297 EP - 300 ER - TY - GEN A1 - Sriperumbuduri, Venkata Pawan A1 - Yacoub, Hady A1 - Wentzel, Andreas A1 - Johansen, Tom K. A1 - Rudolph, Matthias T1 - Design and Analysis of a 50GHz InP DHBT Class-E Power Amplifer Providing 2.3 T2 - 18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin Y1 - 2023 U6 - https://doi.org/10.23919/EuMIC58042.2023.10288688 ER - TY - GEN A1 - Haque, Sanaul A1 - Andrei, Cristina A1 - Yazdani, Hossein A1 - Rudolph, Matthias T1 - On the Survivability of a 28 - 32 GHz GaN Low Noise Amplifier T2 - 18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin Y1 - 2023 SN - 978-2-87487-073-6 SN - 979-8-3503-4833-0 U6 - https://doi.org/10.23919/EuMIC58042.2023.10288728 ER - TY - GEN A1 - Kaule, Evelyne A1 - Luo, Peng A1 - Chevtchenko, Serguei A. A1 - Rudolph, Matthias A1 - Andrei, Cristina T1 - Compact Stacked Rugged GaN Low-Noise Amplifier MMIC under Input Power Overdrive Condition T2 - 18th European Microwave Integrated Circuits Conference (EuMIC),18-19 September 2023, Berlin Y1 - 2023 SN - 978-2-87487-073-6 SN - 979-8-3503-4833-0 U6 - https://doi.org/10.23919/EuMIC58042.2023.10288650 SP - 9 EP - 12 ER - TY - GEN A1 - Beleniotis, Petros A1 - Zervos, Christos A1 - Schnieder, Frank A1 - Rudolph, Matthias T1 - Dynamic RD Modeling by Exploiting Gate Current Dependency of Virtual Gate Effect T2 - 18th European Microwave Integrated Circuits Conference (EuMIC),18-19 September 2023, Berlin Y1 - 2023 SN - 978-2-87487-073-6 SN - 979-8-3503-4833-0 U6 - https://doi.org/10.23919/EuMIC58042.2023.10288955 SP - 1 EP - 4 ER -