TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Engelke, Piet A1 - Vierhaus, Heinrich Theodor ED - Sekanina, Lukas T1 - On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits T2 - 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013 Y1 - 2013 SN - 978-1-4673-6135-4 PB - IEEE Computer Society ER - TY - GEN A1 - Perez-Bosch Quesada, Emilio A1 - Mahadevaiah, Mamathamba Kalishettyhalli A1 - Rizzi, Tommaso A1 - Wen, Jianan A1 - Ulbricht, Markus A1 - Krstic, Milos A1 - Wenger, Christian A1 - Perez, Eduardo T1 - Experimental Assessment of Multilevel RRAM-based Vector-Matrix Multiplication Operations for In-Memory Computing T2 - IEEE Transactions on Electron Devices N2 - Resistive random access memory (RRAM)-based hardware accelerators are playing an important role in the implementation of in-memory computing (IMC) systems for artificial intelligence applications. The latter heavily rely on vector-matrix multiplication (VMM) operations that can be efficiently boosted by RRAM devices. However, the stochastic nature of the RRAM technology is still challenging real hardware implementations. To study the accuracy degradation of consecutive VMM operations, in this work we programed two RRAM subarrays composed of 8x8 one-transistor-one-resistor (1T1R) cells following two different distributions of conductive levels. We analyze their robustness against 1000 identical consecutive VMM operations and monitor the inherent devices’ nonidealities along the test. We finally quantize the accuracy loss of the operations in the digital domain and consider the trade-offs between linearly distributing the resistive states of the RRAM cells and their robustness against nonidealities for future implementation of IMC hardware systems. KW - RRAM KW - Vector Matrix Multiplication KW - variability Y1 - 2023 U6 - https://doi.org/10.1109/TED.2023.3244509 SN - 0018-9383 VL - 70 IS - 4 SP - 2009 EP - 2014 ER - TY - GEN A1 - Mishurova, Tatjana A1 - Sydow, Benjamin A1 - Thiede, Tobias A1 - Sizova, Irina A1 - Ulbricht, Alexander A1 - Bambach, Markus A1 - Bruno, Giovanni T1 - Residual Stress and Microstructure of a Ti-6Al-4V Wire Arc Additive Manufacturing Hybrid Demonstrator T2 - Metals Y1 - 2020 U6 - https://doi.org/10.3390/met10060701 SN - 2075-4701 VL - 6 IS - 10 ER -