TY - CHAP A1 - Scharoba, Stefan A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - On reliability Estimation for Combined Transient and Permanent Fault Handling T2 - 14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014 Y1 - 2014 SN - 978-1-4673-9539-7 SN - 978-1-4673-9540-3 SP - 73 EP - 76 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems T2 - 16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015 Y1 - 2015 SN - 978-1-4673-6710-3 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Urban, Roberto A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor A1 - Altmann, Enrico A1 - Seelig, Horst T1 - Compiler-Centred Microprocessors Design (CoMet) - From C-Code to a VHDL Model of an ASIP T2 - 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings Y1 - 2015 SN - 978-1-4799-6779-7 SN - 978-1-4799-6780-3 SP - 17 EP - 22 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Eggersglüß, S. A1 - Schölzel, Mario T1 - Erzeugung diagnostischer Testmuster unter komplexen Contraints T2 - Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. März 2015, Y1 - 2015 PB - Robert Bosch GmbH CY - Reutlingen ER - TY - GEN A1 - Urban, Roberto A1 - Vierhaus, Heinrich Theodor A1 - Schölzel, Mario A1 - Altmann, Enrico A1 - Seelig, Horst T1 - Non-Cyclic Design Space Exploration for ASIPS - Compiler-Centered Microprocessor Design (CoMet) T2 - Journal of Circuits, Systems and Computers Y1 - 2016 U6 - https://doi.org/10.1142/S0218126616400120 SN - 0218-1266 SN - 1793-6454 VL - 25 IS - 3 ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Müller, Sebastian A1 - Scharoba, Stefan A1 - Röder, Stephanie A1 - Vierhaus, Heinrich Theodor T1 - A Comprehensive Software-Based Self-Test and Self-Repair Method for Statically Scheduled Superscalar Processors T2 - 17th IEEE Latin-American Test Symposium - LATS 2016 Y1 - 2016 SN - 978-1-5090-1331-9 U6 - https://doi.org/10.1109/LATW.2016.7483336 SP - 33 EP - 38 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Skoncej, Patryk A1 - Mühlbauer, Felix A1 - Kubicek, Felix A1 - Schröder, Lukas A1 - Schölzel, Mario T1 - Feasibility of Software-based Repair for Program Memories T2 - 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Sant Feliu de Guixols, Spain, 2016 Y1 - 2016 SN - 978-1-5090-1507-8 SP - 199 EP - 202 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means T2 - IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM) Y1 - 2015 SN - 978-1-4799-6972-2 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - Software-based Repair for Memories in Tiny Embedded Systems T2 - 20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015 Y1 - 2015 SN - 978-1-4799-7603-4 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Skoncej, Patryk A1 - Mühlbauer, Felix A1 - Schölzel, Mario ED - Cunningham, Douglas William ED - Hofstedt, Petra ED - Meer, Klaus ED - Schmitt, Ingo T1 - Softwarebasierte Selbstreparatur von Flash-Speichern für fehlertolerante mikrocontroller-basierte Systeme T2 - Informatik 2015, Tagung vom 28. September – 2. Oktober 2015 in Cottbus Y1 - 2015 SN - 978-3-88579-640-4 SP - 1461 EP - 1473 PB - Gesellschaft für Informatik e.V. CY - Bonn ER - TY - CHAP A1 - Weidling, Stefan A1 - Todtenberg, Nicole A1 - Basmer, Thomas A1 - Schölzel, Mario A1 - Maaser, Michael A1 - Taubert, Matthias T1 - Outdoor Range Measurements in Sub-GHz License-free Radio Bands under Realistic Conditions T2 - MobiWac '17, Proceedings of the 15th ACM International Symposium on Mobility Management and Wireless Access, Miami, Florida, November 21 - 25, 2017, USA Y1 - 2017 SN - 978-1-4503-5163-8 U6 - https://doi.org/10.1145/3132062.3132080 SP - 71 EP - 74 PB - ACM, Digital Library CY - New York, NY ER - TY - GEN A1 - Lehniger, Kai A1 - Aftowicz, Marcin A1 - Schölzel, Mario A1 - Langendörfer, Peter T1 - Coarse-Grained Control Flow Integrity Check for Processors with Sliding Register Windows T2 - 12th Mediterranean Conference on Embedded Computing (MECO) Y1 - 2023 SN - 979-8-3503-2291-0 SN - 979-8-3503-2290-3 U6 - https://doi.org/10.1109/MECO58584.2023.10154928 SN - 2637-9511 ER - TY - GEN A1 - Lehniger, Kai A1 - Schölzel, Mario A1 - Tabatt, Peter A1 - Aftowicz, Marcin A1 - Langendörfer, Peter T1 - Simplified Control Flow Integrity Method for Permutated Programs T2 - Proc. 32. Crypto-Day Matters 2021, (2021) Y1 - 2021 U6 - https://doi.org/10.18420/cdm-2021-32-21 ER - TY - GEN A1 - Lehniger, Kai A1 - Schölzel, Mario A1 - Jelonek, Jonas A1 - Tabatt, Peter A1 - Aftowicz, Marcin A1 - Langendörfer, Peter T1 - Combination of ROP Defense Mechanisms for Better Safety and Security in Embedded Systems T2 - 25th Euromicro Conference on Digital Systems Design (DSD 2022), Maspalomas, Spain, 31 August 2022 - 02 September 2022 Y1 - 2022 SN - 978-1-6654-7404-7 SN - 978-1-6654-7405-4 U6 - https://doi.org/10.1109/DSD57027.2022.00070 SN - 2771-2508 ER - TY - GEN A1 - Tabatt, Peter A1 - Jelonek, Jonas A1 - Schölzel, Mario A1 - Lehniger, Kai A1 - Langendörfer, Peter T1 - Code Mutation as a Mean Against ROP Attacks for Embedded Systems T2 - 11th Mediterranean Conference on Embedded Computing (MECO 2022), Budva, Montenegro, 07-10 June 2022 Y1 - 2022 SN - 978-1-6654-6828-2 SN - 978-1-6654-6827-5 U6 - https://doi.org/10.1109/MECO55406.2022.9797185 SN - 2637-9511 ER -