TY - CHAP A1 - Schölzel, Mario T1 - Ein hybrides Selbsttest- und Reparaturkonzept für VLIW-Prozessoren N2 - Tagungsbeitrag 20. ITG-GI-GMM-Workshop "Zuverlässiglkeit und Entwurf", Wien, Februar 2008 KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2008 N1 - BTU ER - TY - CHAP A1 - Schölzel, Mario T1 - A Delay Estimation of Rescheduling Schemes for Statically Scheduled Processors T2 - Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands KW - Prozessoren KW - Fehlertoleranz Y1 - 2009 SN - 978-3-8007-3133-6 N1 - VDI / VDE SP - 117 EP - 124 PB - VDE-Verlag CY - Berlin [u.a.] ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components T2 - 19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn Y1 - 2014 SN - 978-1-4799-3415-7 PB - IEEE ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems T2 - 16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015 Y1 - 2015 SN - 978-1-4673-6710-3 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Weidling, Stefan A1 - Todtenberg, Nicole A1 - Basmer, Thomas A1 - Schölzel, Mario A1 - Maaser, Michael A1 - Taubert, Matthias T1 - Outdoor Range Measurements in Sub-GHz License-free Radio Bands under Realistic Conditions T2 - MobiWac '17, Proceedings of the 15th ACM International Symposium on Mobility Management and Wireless Access, Miami, Florida, November 21 - 25, 2017, USA Y1 - 2017 SN - 978-1-4503-5163-8 U6 - https://doi.org/10.1145/3132062.3132080 SP - 71 EP - 74 PB - ACM, Digital Library CY - New York, NY ER - TY - GEN A1 - Urban, Roberto A1 - Vierhaus, Heinrich Theodor A1 - Schölzel, Mario A1 - Altmann, Enrico A1 - Seelig, Horst T1 - Non-Cyclic Design Space Exploration for ASIPS - Compiler-Centered Microprocessor Design (CoMet) T2 - Journal of Circuits, Systems and Computers Y1 - 2016 U6 - https://doi.org/10.1142/S0218126616400120 SN - 0218-1266 SN - 1793-6454 VL - 25 IS - 3 ER - TY - CHAP A1 - Skoncej, Patryk A1 - Mühlbauer, Felix A1 - Kubicek, Felix A1 - Schröder, Lukas A1 - Schölzel, Mario T1 - Feasibility of Software-based Repair for Program Memories T2 - 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Sant Feliu de Guixols, Spain, 2016 Y1 - 2016 SN - 978-1-5090-1507-8 SP - 199 EP - 202 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means T2 - IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM) Y1 - 2015 SN - 978-1-4799-6972-2 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario A1 - Skoncej, Patryk A1 - Vater, Frank T1 - Software-based Repair for Memories in Tiny Embedded Systems T2 - 20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015 Y1 - 2015 SN - 978-1-4799-7603-4 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Lehniger, Kai A1 - Schölzel, Mario A1 - Jelonek, Jonas A1 - Tabatt, Peter A1 - Aftowicz, Marcin A1 - Langendörfer, Peter T1 - Combination of ROP Defense Mechanisms for Better Safety and Security in Embedded Systems T2 - 25th Euromicro Conference on Digital Systems Design (DSD 2022), Maspalomas, Spain, 31 August 2022 - 02 September 2022 Y1 - 2022 SN - 978-1-6654-7404-7 SN - 978-1-6654-7405-4 U6 - https://doi.org/10.1109/DSD57027.2022.00070 SN - 2771-2508 ER -