TY - CHAP A1 - Pawlowski, P. A1 - Schölzel, Mario T1 - A Case-Study for Built-In-Self-Repair in Application Specific Processors By Decreasing the Arithmetic Accuracy Y1 - 2006 ER - TY - CHAP A1 - Schölzel, Mario T1 - Synthesis of Application Specific Processors - A Look at High-Level-approaches for Developing Application Specific Processors Y1 - 2006 ER - TY - CHAP A1 - Schölzel, Mario A1 - Bachmann, Peter T1 - Durchgängiger automatisierter Entwurf von der Prozessor-Architektur bis zur Anwendungs-Software T2 - Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), Ehrenkolloquium für Prof. Dr.-Ing. Günter Elst, 10. - 11. Mai 2006 Y1 - 2006 SP - 19 EP - 24 PB - Fraunhofer-Institut CY - Dresden ER - TY - RPRT A1 - Henkel, Karsten A1 - Paloumpa, Ioanna A1 - Oprea, A. A1 - Appel, Günter A1 - Schmeißer, Dieter A1 - Frandsen, W. A1 - Schölzel, Mario T1 - Entwicklung von Sensoren mit Elektroden aus leitfähigen Polymeren Y1 - 2000 N1 - Teilbericht 16SV335/7 im Gemeinsamen Abschlussbericht zum Verbundprojekt "Sensoren mit mikrostrukturierten Elektroden aus leitfähigen Polymeren", März 2000, Kurzfassung ER - TY - CHAP A1 - Ulbricht, Markus A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors T2 - IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011 N2 - Tagungsbeitrag DDECS 2011, Cottbus KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2011 UR - www.computer.org SN - 978-1-4244-9755-3 N1 - IEEE Computer Society SP - 143 EP - 146 ER - TY - CHAP A1 - Ulbricht, Markus A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors N2 - Tagungsbeitrag 23. ITG-Tagung "Test und Zuverlässigeit von Schaltungen und Systemen", Passau, 2011 KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2011 N1 - BTU ER - TY - CHAP A1 - Schölzel, Mario T1 - Scaling the Discrete Cosine Transformation for Fault-Torelant Real-Time Execution T2 - Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings Y1 - 2009 SN - 978-83-62065-00-4 N1 - BTU SP - 19 EP - 24 PB - Univ. of Technology, Fac. of Computing Science and Management CY - Poznan ER - TY - CHAP A1 - Koal, Tobias A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Dependability and Life Time Enhancement for Nano-Electronic Systems T2 - Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings KW - ICs KW - Mikroelektronik KW - Zuverlässigkeit Y1 - 2011 SN - 978-83-62065-02-8 N1 - BTU SP - 61 EP - 67 PB - Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering CY - Poznan ER - TY - CHAP A1 - Koal, Tobias A1 - Scheit, Daniel A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - On the Feasibility of Built-in Self Repair for Logic Circuits T2 - 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011 KW - ICs KW - Test KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2011 SN - 978-1-4577-1713-0 N1 - IEEE Computer Society SP - 316 EP - 324 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario T1 - Fine-Grained Software-Based Self Repair of VLIW Processors T2 - 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011 KW - Prozessoren KW - Test KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2011 SN - 978-1-4577-1713-0 N1 - IEEE Computer Society SP - 41 EP - 49 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Müller, Sebastian A1 - Schölzel, Mario T1 - Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths T2 - 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010 KW - Prozessoren KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2010 SN - 978-1-424-48447-8 N1 - IEEE Computer Society SP - 90 EP - 98 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario T1 - A Delay Estimation of Rescheduling Schemes for Statically Scheduled Processors T2 - Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands KW - Prozessoren KW - Fehlertoleranz Y1 - 2009 SN - 978-3-8007-3133-6 N1 - VDI / VDE SP - 117 EP - 124 PB - VDE-Verlag CY - Berlin [u.a.] ER - TY - CHAP A1 - Schölzel, Mario T1 - Reduced Triple Modular Redundancy for Built-in Self Repair in VLIW Processors N2 - Tagungsbeitrag IEEE SPA 2007, Poznan KW - Prozessoren KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2007 N1 - BTU ER - TY - CHAP A1 - Schölzel, Mario T1 - Ein hybrides Selbsttest- und Reparaturkonzept für VLIW-Prozessoren N2 - Tagungsbeitrag 20. ITG-GI-GMM-Workshop "Zuverlässiglkeit und Entwurf", Wien, Februar 2008 KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2008 N1 - BTU ER - TY - BOOK A1 - Vierhaus, Heinrich Theodor A1 - Steininger, Andreas A1 - Pawlak, A. A1 - Kraemer, Rolf A1 - Schölzel, Mario A1 - Raik, Jaan T1 - Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems Y1 - 2011 SN - 978-1-4244-9753-9 PB - Piscataway : IEEE, 2011 ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor ED - Raik, Jaan T1 - An Adaptive Self-Test Routine for In-Field Diagnosis of Permanent Faults in Simple RISC Cores T2 - Proceedings, 15th IEEE Interantional Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, April 2012 Y1 - 2012 SN - 978-1-4673-1185-4 SP - 312 EP - 317 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Müller, Sebastian A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Hierarchical Self-repair in Heterogenous Multi-core Systems by Means of a Software-based Reconfiguration T2 - VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops Y1 - 2012 SN - 978-1-4673-1913-3 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Adaptiver softwarebasierter Selbsttest einfacher RISC-Prozessoren zur Lokalisierung von permanenten Fehlern im Feld T2 - Dresdner Arbeitstagung für Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband Y1 - 2012 SN - 978-3-8396-0404-5 SP - 150 EP - 155 PB - Fraunhofer IIS, Institutsteil EAS [u.a.] CY - Dresden ER - TY - CHAP A1 - Müller, Sebastian A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Towards a Graceful Degradable Multicore-System by hierarchical Handling of Hard Errors T2 - DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st Euromicro PDP Conference Y1 - 2013 SN - 978-146-735-321-2 SP - 302 EP - 309 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Urban, Roberto A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor ED - Dietrich, Manfred T1 - Compilerzentrierter Mikroprozessor T2 - Tagungsband Dredner Arbeitstagung für Schaltungs- und Systementwurf (DASS 2013) Y1 - 2013 SN - 978-3-8396-0545-5 PB - Fraunhofer-Verl. CY - Stuttgart ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Röder, Stephanie A1 - Vierhaus, Heinrich Theodor T1 - Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components T2 - Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013) Y1 - 2013 PB - IEEE CY - Piscataway ER -