TY - CHAP A1 - Schölzel, Mario T1 - Globale Registerallokation für irreguläre Registerarchitekturen durch Graphfärbung T2 - Informatiktage 2001, fachwissenschaftlicher Informatik-Kongreß, 9. und 10. November 2001 im Neuen Kloster Bad Schussenried Y1 - 2001 PB - Konradin-Verl. Kohlhammer CY - Leinfelden-Echterdingen ER - TY - CHAP A1 - Schölzel, Mario A1 - Bachmann, Peter A1 - Vierhaus, Heinrich Theodor ED - Dabrowski, Adam T1 - Application Specific Processor Design for Digital Signal Processing T2 - Signal processing '2004, workshop proceedings, Poznan, 24th September 2004 Y1 - 2004 SN - 83-913251-5-6 SP - 7 EP - 15 PB - Poznan Univ. of Technology CY - Poznan ER - TY - CHAP A1 - Schölzel, Mario T1 - HW / SW Co-Detection of Transient and Permanent Faults with Fast Recovery in Statically Scheduled Data Paths T2 - 2010 Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, Dresden, Germany, 8 - 12 March 2010 Y1 - 2010 SN - 978-1-4244-7054-9 SP - 723 EP - 728 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario T1 - Software-Based Self-Repair of Statically Scheduled Superscalar Data Paths Y1 - 2010 ER - TY - CHAP A1 - Schölzel, Mario T1 - Möglichkeiten und Grenzen der Software-basierten Selbstreparatur in statisch geplanten superskalaren Prozessorarchitekturen Y1 - 2010 ER - TY - CHAP A1 - Schölzel, Mario T1 - Time-Constrained Clustering for DSE of Clustered VLIW-ASP T2 - 2007 Design, Automation & Test in Europe Conference & Exhibition, Nice, France, 16 - 20 April 2007 Y1 - 2007 SN - 978-3-9810801-2-4 SP - 467 EP - 472 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - CHAP A1 - Pawlowski, P. A1 - Schölzel, Mario T1 - A Case-Study for Built-In-Self-Repair in Application Specific Processors By Decreasing the Arithmetic Accuracy Y1 - 2006 ER - TY - CHAP A1 - Schölzel, Mario T1 - Synthesis of Application Specific Processors - A Look at High-Level-approaches for Developing Application Specific Processors Y1 - 2006 ER - TY - CHAP A1 - Schölzel, Mario A1 - Bachmann, Peter T1 - Durchgängiger automatisierter Entwurf von der Prozessor-Architektur bis zur Anwendungs-Software T2 - Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), Ehrenkolloquium für Prof. Dr.-Ing. Günter Elst, 10. - 11. Mai 2006 Y1 - 2006 SP - 19 EP - 24 PB - Fraunhofer-Institut CY - Dresden ER - TY - CHAP A1 - Heinig, Andy A1 - Schölzel, Mario T1 - Zeitbeschränkte Clusterung zur Design-Space-Exploration geclusterter VLIW-Prozessoren T2 - Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006 in Dresden Y1 - 2006 SN - 3-9810287-1-6 SP - 319 EP - 328 PB - Fraunhofer-Institut für Integrierte Schaltungen, Außenstelle Entwurfsautomatisierung CY - Dresden ER - TY - CHAP A1 - Scholz, Sebastian A1 - Schölzel, Mario T1 - Design-Space-Exploration Using Simulated Annealing Y1 - 2005 ER - TY - CHAP A1 - Schölzel, Mario A1 - Bachmann, Peter T1 - DESCOMP: A New Design Space Exploration Approach T2 - Systems aspects in organic and pervasive computing - ARCS 2005, 18th International Conference on Architecture of Computing Systems, Innsbruck, Austria, March 14 - 17, 2005, proceedings Y1 - 2005 SN - 3-540-25273-8 SP - 178 EP - 192 PB - Springer CY - Berlin [u.a.] ER - TY - CHAP A1 - Ulbricht, Markus A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors T2 - IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011 N2 - Tagungsbeitrag DDECS 2011, Cottbus KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2011 UR - www.computer.org SN - 978-1-4244-9755-3 N1 - IEEE Computer Society SP - 143 EP - 146 ER - TY - CHAP A1 - Ulbricht, Markus A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - A New Hiararchical Built-In SElf Test with On-Chip Diagnosis for VLIW Processors N2 - Tagungsbeitrag 23. ITG-Tagung "Test und Zuverlässigeit von Schaltungen und Systemen", Passau, 2011 KW - Prozessoren KW - Test KW - Zuverlässigkeit Y1 - 2011 N1 - BTU ER - TY - CHAP A1 - Schölzel, Mario T1 - Reduced Triple Modular Redundancy for Built-in Self Repair in VLIW Processors N2 - Tagungsbeitrag IEEE SPA 2007, Poznan KW - Prozessoren KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2007 N1 - BTU ER - TY - CHAP A1 - Schölzel, Mario T1 - Scaling the Discrete Cosine Transformation for Fault-Torelant Real-Time Execution T2 - Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings Y1 - 2009 SN - 978-83-62065-00-4 N1 - BTU SP - 19 EP - 24 PB - Univ. of Technology, Fac. of Computing Science and Management CY - Poznan ER - TY - CHAP A1 - Koal, Tobias A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Dependability and Life Time Enhancement for Nano-Electronic Systems T2 - Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings KW - ICs KW - Mikroelektronik KW - Zuverlässigkeit Y1 - 2011 SN - 978-83-62065-02-8 N1 - BTU SP - 61 EP - 67 PB - Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering CY - Poznan ER - TY - CHAP A1 - Koal, Tobias A1 - Scheit, Daniel A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - On the Feasibility of Built-in Self Repair for Logic Circuits T2 - 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011 KW - ICs KW - Test KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2011 SN - 978-1-4577-1713-0 N1 - IEEE Computer Society SP - 316 EP - 324 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Schölzel, Mario T1 - Fine-Grained Software-Based Self Repair of VLIW Processors T2 - 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011 KW - Prozessoren KW - Test KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2011 SN - 978-1-4577-1713-0 N1 - IEEE Computer Society SP - 41 EP - 49 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Müller, Sebastian A1 - Schölzel, Mario T1 - Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths T2 - 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010 KW - Prozessoren KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2010 SN - 978-1-424-48447-8 N1 - IEEE Computer Society SP - 90 EP - 98 PB - IEEE CY - Piscataway, NJ ER -