TY - GEN A1 - Ratzke, Markus A1 - Wolfframm, Dirk A1 - Kappa, Mathias A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Pulsed laser deposition of HfO2 and Pr(x)O(y) high-k films on Si(100) T2 - Applied Surface Science Y1 - 2005 SN - 0169-4332 VL - 247 IS - 1-4 SP - 128 EP - 133 ER - TY - JOUR A1 - Costache, Florenta Adriana A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Sub-damage-threshold femtosecond laser ablation from crystalline silicon: surface nanostructures and phase transformation JF - Applied Physics A Y1 - 2004 SN - 0947-8396 SN - 1432-0630 VL - 79 IS - 4-6 SP - 1429 EP - 1432 ER - TY - JOUR A1 - Kouteva-Arguirova, Simona A1 - Orlov, V. I. A1 - Seifert, Winfried A1 - Reif, Jürgen A1 - Richter, H. T1 - Raman Investigation of Stress and Phase Transformation Induced in Silicon by Indentation at High Temperatures JF - European Physics Journal of Applied Physics Y1 - 2004 SN - 1286-0042 SN - 1286-0050 VL - 27 IS - 1-3 SP - 279 EP - 283 ER - TY - JOUR A1 - Mtchedlidze, T. A1 - Arguirov, Tzanimir V. A1 - Kouteva-Arguirova, Simona A1 - Jia, G. A1 - Kittler, Martin A1 - Rölver, R. A1 - Berghoff, B. A1 - Först, M. A1 - Batzner, D. L. A1 - Spangenberg, B. T1 - Influence of a substrate, structure and annealing procedures on crystalline and optical properties of Si/SiO2 multiple quantum wells Y1 - 2008 ER - TY - JOUR A1 - Mtchedlidze, T. A1 - Arguirov, Tzanimir V. A1 - Kouteva-Arguirova, Simona A1 - Kittler, Martin A1 - Rölver, R. A1 - Berghoff, B. A1 - Batzner, D. L. A1 - Spangenberg, B. T1 - Light-induced solid-to-solid phase transformation in Si nanolayers of Si.SiO2 multiple quantum wells JF - Physical Review B Y1 - 2008 SN - 1098-0121 VL - 77 IS - 16 SP - 161304 ER - TY - JOUR A1 - Arguirov, Tzanimir V. A1 - Akhmetov, V. D. A1 - Kouteva-Arguirova, Simona A1 - Kittler, Martin A1 - Rölver, R. A1 - Berghoff, B. A1 - Först, M. A1 - Batzner, D. L. A1 - Spangenberg, B. A1 - Mtchedlidze, T. T1 - Effect of laser annealing on crystallinity of the Si layers in Si/SiO2 multiple quantum wells Y1 - 2007 ER - TY - CHAP A1 - Ratzke, Markus A1 - Kappa, Mathias A1 - Wolfframm, Dirk A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - PLD of high-k dielectric films on silicon T2 - Fifth International Symposium on Laser Precision Microfabrication, 11 - 14 May 2004, Nara, Japan Y1 - 2004 SN - 0-8194-5623-3 SP - 406 EP - 411 PB - SPIE CY - Bellingham, Wash. ER - TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Kouteva-Arguirova, Simona T1 - Femtosecond laser-induced nanostructuring and phase transformation of crystalline silicom Y1 - 2004 ER - TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Arguirov, Tzanimir V. A1 - Wolfframm, Dirk A1 - Reif, Jürgen T1 - Influence of Local Heating on Micro-Raman Spectroscopy of Silicon T2 - Journal of Applied Physics Y1 - 2003 SN - 1089-7550 VL - 94 SP - 4946 ER - TY - JOUR A1 - Costache, Florenta Adriana A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Self-Assembled Surface Patterning and Structural Modification upon Femtosecond Laser Processing of Crystalline Silicon Y1 - 2004 ER - TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Orlov, Valeri A1 - Seifert, Winfried A1 - Richter, Hans A1 - Reif, Jürgen T1 - Residual stress distribution and silicon phase transformation induced by Rockwell indentation at different temperatures, studied by means of micro-Raman spectroscopy T2 - Solid State Phenomena Y1 - 2004 SN - 1662-9779 SN - 0377-6883 VL - 95-96 SP - 513 EP - 518 ER - TY - CHAP A1 - Reif, Jürgen A1 - Costache, Florenta Adriana A1 - Eckert, Sebastian A1 - Kouteva-Arguirova, Simona A1 - Bestehorn, Michael A1 - Georgescu, Ionut A1 - Semorek, A. F. A1 - Martin, P. A1 - Gobert, O. A1 - Seifert, Winfried T1 - Formation of self-organized regular nanostructures upon femtosecond laser ablation T2 - Fifth International Symposium on Laser Precision Microfabrication, 11 - 14 May, 2004, Nara, Japan Y1 - 2004 SN - 0-8194-5623-3 SP - S. 737 PB - SPIE CY - Bellingham, Wash. ER - TY - GEN A1 - Wolfframm, Dirk A1 - Kouteva-Arguirova, Simona A1 - Arguirov, Tzanimir V. A1 - Schmid, Reiner P. A1 - Dittmar, K. A1 - Zienert, I. A1 - Reif, Jürgen T1 - Hafnium oxide on silicon: A non-destructive characterization of the interfacial layer T2 - Solid State Phenomena Y1 - 2004 UR - http://www.scientific.net/SSP.95-96.653.pdf SN - 1662-9779 SN - 0377-6883 VL - 95-96 SP - 653 EP - 658 ER - TY - GEN A1 - Wolfframm, Dirk A1 - Ratzke, Markus A1 - Kouteva-Arguirova, Simona A1 - Reif, Jürgen T1 - Praseodymium Oxide growth on Si(100) by pulsed laser deposition T2 - Materials Science and Semiconductor Processing Y1 - 2002 SN - 1369-8001 VL - 5 IS - 4-5 SP - 429 EP - 434 ER - TY - GEN A1 - Kouteva-Arguirova, Simona A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Raman Measurement of Stress Distribution in Multicrystalline Silicon Materials T2 - Materials Science and Engineering B Y1 - 2003 SN - 0921-5107 VL - 102 IS - 1/3 SP - 37 EP - 42 ER -