TY - CHAP A1 - Kothe, René A1 - Galke, Christian A1 - Vierhaus, Heinrich Theodor T1 - A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features T2 - 11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings] Y1 - 2005 SN - 0-7695-2406-0 SP - 241 EP - 246 PB - Los Alamitos, Calif. [u.a.] CY - IEEE Computer Society ER - TY - CHAP A1 - Galke, Christian A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Logic Self Repair T2 - Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main Y1 - 2006 SN - 978-3-88579-175-1 SP - 36 EP - 44 PB - Ges. für Informatik CY - Bonn ER - TY - JOUR A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - A Scan Controller Concept for Low-Power Scan Test KW - Test KW - Low-Power Y1 - 2008 N1 - American Science Publishers Inc. ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Test Data and Power Reductions for Transition Delay Tests for Massive Parallel Scan Structures T2 - 2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010 KW - ICs KW - Test KW - low-power Y1 - 2010 N1 - IEEE Computer Society SP - 283 EP - 290 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor A1 - Coym, Torsten A1 - Vermeiren, W. A1 - Straube, B. T1 - Embedded Self Repair by Transistor and Gate Level Reconfiguration T2 - Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006 KW - ICs KW - SoCs KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2006 SN - 1-4244-0185-2 N1 - IEEE Computer Society SP - 208 EP - 213 PB - IEEE ER - TY - CHAP A1 - Galke, Christian A1 - Kothe, René A1 - Schultke, Sabine A1 - Winkler, Christin A1 - Honko, Jeanette A1 - Vierhaus, Heinrich Theodor T1 - Embedded Scan Test with Diagnostic Features for Self-Testing SoCs T2 - Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006 KW - ICs KW - Test KW - Selbsttest Y1 - 2006 SN - 978-0-7695-2620-1 N1 - IEEE Computer Society SP - 181 EP - 182 PB - IEEE Computer Society CY - Los Alamitos, Calif. [u.a.] ER - TY - CHAP A1 - Habermann, Sven A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Built-in Self Repair by Reconfiguration of FPGAs T2 - Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006 KW - ICs KW - FPGAs KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2006 SN - 978-0-7695-2620-1 N1 - IEEE Computer Society SP - 187 EP - 188 PB - IEEE Computer Society CY - Los Alamitos, Calif [u.a.] ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Flip-Flops and Scan Path Elements for Nanoelectronics T2 - Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007 KW - ICs KW - Test KW - Zuverlässigkeit KW - Fehlertoleranz Y1 - 2007 SN - 1-4244-1162-9 N1 - IEEE Computer Society PB - IEEE ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor ED - Sattler, Sebastian T1 - Reparaturfunktionen für Bus-Strukturen auf SoCs T2 - Zuverlässigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. März 2007 in München KW - ICs KW - SoCs KW - Test KW - Selbstreparatur Y1 - 2007 SN - 978-3-8007-3023-0 SN - 3-8007-3023-5 SP - 77 EP - 84 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Repair Functions and Redundancy Management for Bus Structures T2 - Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland KW - ICs KW - Zuverlässigkeit KW - Fehlertoleranz Y1 - 2007 SN - 978-3-8007-3015-5 N1 - VDI / VDE PB - VDE-Verlag CY - Berlin [u.a.] ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor ED - Dabrowski, Adam T1 - An Embedded Test Strategy for Global and Regiional Interconnects on SoCs T2 - Signal processing '2006, workshop proceedings, Poznan, 29th September 2006 KW - Bus-Test KW - ICs KW - Test Y1 - 2006 SN - 83-913251-7-2 SP - 65 EP - 70 CY - Poznan ER - TY - CHAP A1 - Kothe, René A1 - Galke, Christian A1 - Vierhaus, Heinrich Theodor T1 - Redundanz-Management und Fehlerisolierung für die Selbstreparatur in digitalen und analogen Schaltungen T2 - ANALOG '06, Vorträge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden KW - ICs KW - SoCs KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2006 SN - 978-3-8007-2988-3 SP - 57 EP - 62 PB - VDE-Verlag CY - Berlin [u.a] ER - TY - CHAP A1 - Kothe, René A1 - Habermann, Sven A1 - Vierhaus, Heinrich Theodor A1 - Coym, Torsten A1 - Vermeiren, W. A1 - Straube, B. T1 - Selbstreparatur von Logik-Baugruppen in hochintegrieten Schaltungen- Möglichkeiten und Grenzen T2 - Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006 KW - ICs KW - SoCs KW - Fehlertoleranz KW - Selbstreparatur Y1 - 2006 PB - Fraunhofer-Institut CY - Dresden ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Embedded Fault Diagnosis Exploiting Regularity N2 - Tagungsbeitrag IEEE SPA07, Poznan KW - ICs KW - SoCs KW - Fehler KW - Test KW - Diagnose Y1 - 2007 N1 - BTU ER - TY - CHAP A1 - Frost, Raik A1 - Rudolph, D. A1 - Galke, Christian A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - A Configurable Modular Test Processor and Scan Controller Architecture T2 - Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007 KW - ICs KW - SoCs KW - Test KW - Selbsttest Y1 - 2007 SN - 0-7695-2918-6 N1 - IEEE Computer Society SP - 277 EP - 284 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor ED - Fanucci, Luca T1 - Embedded Diagnostic Logic Test Exploiting Regularity T2 - Proceedings, 11th EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools, 2008, DSD '08, 3 - 5 Sept. 2008, Parma, Italy KW - IC-Test Y1 - 2008 N1 - IEEE Computer Society SP - 873 EP - 879 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Fehlerhärtung und Fehlertoleranz für Flip-Flops und Scan-Path-Elemente T2 - Tagungsband, Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2007), 8. - 9. Mai 2007 Y1 - 2007 SN - 978-3-940046-28-4 SP - 67 EP - 72 PB - TUDpress CY - Dresden ER - TY - RPRT A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Diagnostics Logic Testing Based on Advanced Scan Technology and an Embedded Test Processor Y1 - 2007 SN - 1437-7969 PB - BTU CY - Cottbus ER - TY - CHAP A1 - Kothe, René A1 - Scheit, Daniel A1 - Vierhaus, Heinrich Theodor ED - Elst, G. T1 - Angepasste Fehlerdiagnose für die Selbstreparatur in logischen Schaltungen T2 - Dresdner Arbeitstagung Schaltungs- und Systementwurf, (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008 Y1 - 2008 SN - 3-9810287-2-4 PB - Fraunhofer Institut für integrierte Schaltungen CY - Dresden ER - TY - CHAP A1 - Kothe, René A1 - Galke, Christian A1 - Schultke, Sabine A1 - Fröschke, Henry A1 - Gaede, Steffen A1 - Vierhaus, Heinrich Theodor T1 - Hardware/Software Based Hierarchical Self Test for SoCs T2 - Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic Y1 - 2006 SN - 1-4244-0185-2 SP - 157 EP - 158 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - GEN A1 - Kothe, René A1 - Habermann, Sven A1 - Vierhaus, Heinrich Theodor T1 - Selbstreparatur von Logik-Baugruppen in hochintegrierten Schaltungen - Möglichkeiten und Grenzen T2 - Forum der Forschung Y1 - 2006 SN - 0947-6989 VL - 10 IS - 19 SP - 125 EP - 130 ER - TY - CHAP A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - Fault Diagnosis in Logic Circuits Exploiting Regularity T2 - Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008 Y1 - 2008 SN - 978-3-8007-3101-5 SP - 57 EP - 62 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - CHAP A1 - Koal, Tobias A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - SoC Self Test Based on a Test Processor T2 - Design an Test Technology for Dependable Systems on Chip Y1 - 2011 SN - 978-1-6096-0212-3 SP - 360 EP - 375 PB - IGI Global CY - Hershey [u.a.] ER -