TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Vierhaus, Heinrich Theodor ED - Raik, Jaan T1 - Combining On-Line Fault Detection and Logic Self Repair T2 - IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012 Y1 - 2012 SN - 978-1-4673-1185-4 SP - 288 EP - 293 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Engelke, Piet A1 - Vierhaus, Heinrich Theodor T1 - Kombinierte On-Line-Fehlerkompensation und Selbstreparatur für Logik-Baugruppen T2 - Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden Y1 - 2013 PB - Fraunhofer-Institut CY - Dresden ER - TY - CHAP A1 - Koal, Tobias A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware T2 - IEEE International Symposium DDECS 2014, Warschau Y1 - 2014 SN - 978-1-4799-4560-3 SP - 153 EP - 159 PB - IEEE CS Press ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Reconfigurable High Performance Architectures T2 - 19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn Y1 - 2014 SN - 978-1-4799-3415-7 PB - IEEE ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components T2 - 19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn Y1 - 2014 SN - 978-1-4799-3415-7 PB - IEEE ER - TY - CHAP A1 - Müller, Sebastian A1 - Koal, Tobias A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Timing for Virtual TMR in Logic Circuits T2 - IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014 Y1 - 2014 SN - 978-1-4799-5324-0 ER - TY - CHAP A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Probleme bei Erzeugung und simulationsbasierten Validierung softwarebasierter Selbsttests zur feingranularen Diagnose T2 - DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband Y1 - 2014 SN - 978-3-8396-0738-1 PB - Fraunhofer Verlag CY - Stuttgart ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults T2 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014 Y1 - 2014 SN - 978-1-4799-6155-9 SN - 978-1-4799-6156-6 SP - 27 EP - 32 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - Combining Correction of Delay Faults and Transient Faults T2 - 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015 Y1 - 2015 SN - 978-1-4799-6780-3 SP - 99 EP - 102 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Scharoba, Stefan A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Combined Detection and Correction of Transient Faults and Delay Faults T2 - ZuE 2015, Zuverlässigkeit und Entwurf, Beiträge der 8. GMM/ITG/GI-Fachtagung 21. – 23. September 2015 in Siegen Y1 - 2015 SN - 978-3-8007-4071-0 PB - VDE-Verlag CY - Berlin ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems T2 - 16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015 Y1 - 2015 SN - 978-1-4673-6710-3 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - Exploring diagnostic capabilities of software-based self-tests for production and in-field application T2 - Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic Y1 - 2015 SN - 978-1-4799-6970-8 SN - 978-1-4799-6973-9 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER -