TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Adaptiver softwarebasierter Selbsttest einfacher RISC-Prozessoren zur Lokalisierung von permanenten Fehlern im Feld T2 - Dresdner Arbeitstagung für Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband Y1 - 2012 SN - 978-3-8396-0404-5 SP - 150 EP - 155 PB - Fraunhofer IIS, Institutsteil EAS [u.a.] CY - Dresden ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Engelke, Piet A1 - Vierhaus, Heinrich Theodor ED - Sekanina, Lukas T1 - On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits T2 - 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013 Y1 - 2013 SN - 978-1-4673-6135-4 PB - IEEE Computer Society ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Engelke, Piet A1 - Vierhaus, Heinrich Theodor ED - Dietrich, Manfred T1 - On-Line-Test, Fehlerkorrektur znd Selbstreparatur mit Time-Shared TMR T2 - Tagungsband Dresdner Arbeitstagung für Schaltungs- und Systementwurf (DASS), April 2013 Y1 - 2013 SN - 978-3-8396-0545-5 PB - Fraunhofer-Verl. CY - Stuttgart ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Röder, Stephanie A1 - Vierhaus, Heinrich Theodor T1 - Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components T2 - Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013) Y1 - 2013 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Vierhaus, Heinrich Theodor T1 - Virtual TMR Schemes Combining Fault Tolerance and Self Repair T2 - 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain Y1 - 2013 SN - 978-0-7695-5074-9 SP - 235 EP - 242 PB - IEEE ER - TY - CHAP A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Logic Self Repair Based on Regular Building Blocks T2 - Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands Y1 - 2009 SN - 978-3-8007-3133-6 SP - 71 EP - 76 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - CHAP A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Built-in Self Repair for Logic Structures T2 - Design and test technology for dependable systems-on-chip Y1 - 2011 SN - 978-1-6096-0212-3 PB - Information Science Reference CY - Hershay, Pa. [u.a.] ER - TY - CHAP A1 - Koal, Tobias A1 - Kothe, René A1 - Vierhaus, Heinrich Theodor T1 - SoC Self Test Based on a Test Processor T2 - Design an Test Technology for Dependable Systems on Chip Y1 - 2011 SN - 978-1-6096-0212-3 SP - 360 EP - 375 PB - IGI Global CY - Hershey [u.a.] ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Vierhaus, Heinrich Theodor ED - Raik, Jaan T1 - Combining On-Line Fault Detection and Logic Self Repair T2 - IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012 Y1 - 2012 SN - 978-1-4673-1185-4 SP - 288 EP - 293 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Ulbricht, Markus A1 - Engelke, Piet A1 - Vierhaus, Heinrich Theodor T1 - Kombinierte On-Line-Fehlerkompensation und Selbstreparatur für Logik-Baugruppen T2 - Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden Y1 - 2013 PB - Fraunhofer-Institut CY - Dresden ER - TY - CHAP A1 - Koal, Tobias A1 - Schölzel, Mario A1 - Vierhaus, Heinrich Theodor T1 - Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware T2 - IEEE International Symposium DDECS 2014, Warschau Y1 - 2014 SN - 978-1-4799-4560-3 SP - 153 EP - 159 PB - IEEE CS Press ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Reconfigurable High Performance Architectures T2 - 19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn Y1 - 2014 SN - 978-1-4799-3415-7 PB - IEEE ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components T2 - 19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn Y1 - 2014 SN - 978-1-4799-3415-7 PB - IEEE ER -