TY - GEN A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - Combining Correction of Delay Faults and Transient Faults T2 - 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015 Y1 - 2015 SN - 978-1-4799-6780-3 SP - 99 EP - 102 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Scharoba, Stefan A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Combined Detection and Correction of Transient Faults and Delay Faults T2 - ZuE 2015, Zuverlässigkeit und Entwurf, Beiträge der 8. GMM/ITG/GI-Fachtagung 21. – 23. September 2015 in Siegen Y1 - 2015 SN - 978-3-8007-4071-0 PB - VDE-Verlag CY - Berlin ER - TY - CHAP A1 - Schölzel, Mario A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems T2 - 16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015 Y1 - 2015 SN - 978-1-4673-6710-3 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Scharoba, Stefan A1 - Vierhaus, Heinrich Theodor T1 - Exploring diagnostic capabilities of software-based self-tests for production and in-field application T2 - Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic Y1 - 2015 SN - 978-1-4799-6970-8 SN - 978-1-4799-6973-9 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Koal, Tobias A1 - Eggersglüß, S. A1 - Schölzel, Mario T1 - Erzeugung diagnostischer Testmuster unter komplexen Contraints T2 - Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. März 2015, Y1 - 2015 PB - Robert Bosch GmbH CY - Reutlingen ER - TY - CHAP A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Redundancy evaluation process of processor components for permanent fault compensation T2 - 2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montréal, Quebec, Canada, 15-18 June 2015 Y1 - 2015 SN - 978-1-4673-7501-6 SN - 978-1-4673-7502-3 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Scharoba, Stefan A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Correcting Delay Faults and Transient Faults in Pipelines T2 - 8. GMM/ITG/GI-Symposium Reliability by Design, Siegen, Germany, 21-23 Sept. 2015 Y1 - 2015 SN - 978-3-8007-4071-0 SP - 7 ER -