TY - JOUR A1 - Arguirov, Tzanimir V. A1 - Seifert, Winfried A1 - Kittler, Martin A1 - Reif, Jürgen T1 - Temperature Behaviour of Extended Defects in Solar Grade Silicon Investigated by Photoluminescence and EBIC Y1 - 2003 ER - TY - JOUR A1 - Arguirov, Tzanimir V. A1 - Kittler, Martin A1 - Seifert, Winfried A1 - Reif, Jürgen A1 - Bolze, D. A1 - Ehwald, K.-E. A1 - Formanek, Peter T1 - Luminescence of Crystal Defects Formed after Annealing of Phosphorus Implanted Silicon JF - Solid State Phenomena Y1 - 2004 SN - 1012-0394 N1 - Proceedings of the GADEST 2003 VL - 95-96 SP - 289 EP - 296 ER - TY - JOUR A1 - Ratzke, Markus A1 - Yu, Xuegong A1 - Vyvenko, Oleg F. A1 - Reif, Jürgen A1 - Kittler, Martin A1 - Reiche, Manfred T1 - Scanning Probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding JF - Physica Status Solidi C Y1 - 2007 SN - 1610-1634 VL - 4 IS - 8 SP - 2893 EP - 3897 ER - TY - CHAP A1 - Kittler, Martin A1 - Arguirov, Tzanimir V. A1 - Seifert, Winfried ED - Robbins, David J. T1 - Silicon-based Light Emission after Ion Implantation T2 - Optoelectronic integration on silicon, 27 - 28 January 2004, San Jose, California, USA Y1 - 2004 SN - 0-8194-5265-3 SP - S. 164 PB - SPIE CY - Bellingham, Wash. ER - TY - CHAP A1 - Hoffmann, Patrick A1 - Mikalo, Ricardo Pablo A1 - Batchelor, David R. A1 - Beuckert, Guido A1 - Schmeißer, Dieter A1 - Kittler, Martin A1 - Ourmazd, A. A1 - Lewerenz, Hans-Joachim T1 - Solare Energieumwandlung in dünnen Schichten Y1 - 2000 ER - TY - JOUR A1 - Hoffmann, Patrick A1 - Mikalo, Ricardo Pablo A1 - Schmeißer, Dieter A1 - Kittler, Martin T1 - A spectro-microscopic approach to study the morphology and elemental distribution of mc-Si surfaces Y1 - 1999 ER - TY - GEN A1 - Schmid, Reiner P. A1 - Mankovics, Daniel A1 - Arguirov, Tzanimir V. A1 - Ratzke, Markus A1 - Mtchedlidze, T. A1 - Kittler, Martin T1 - Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature T2 - Physica Status Solidi : A Y1 - 2011 U6 - https://doi.org/10.1002/pssa.201026269 SN - 1610-1642 VL - 208 IS - 4 SP - 888 EP - 892 ER - TY - GEN A1 - Schmid, Reiner P. A1 - Mankovics, Daniel A1 - Arguirov, Tzanimir V. A1 - Mtchedlidze, T. A1 - Kittler, Martin T1 - Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches Y1 - 2011 ER - TY - GEN A1 - Steffens, S. A1 - Becker, C. A1 - Amkreutz, Daniel A1 - Klossek, André A1 - Kittler, Martin A1 - Chen, Y.-Y. A1 - Schnegg, Alexander A1 - Klingsporn, Max A1 - Abou-Ras, Daniel A1 - Lips, Klaus A1 - Rech, Bernd T1 - Impact of Dislocations and Dangling Bond Defects on The Electrical Performance of Crystalline Silicon Thin Films T2 - Applied Physics Letters Y1 - 2014 U6 - https://doi.org/10.1063/1.4890625 SN - 1077-3118 SN - 0003-6951 VL - 105 IS - 2 SP - 022108 ER - TY - CHAP A1 - Reiche, Manfred A1 - Kittler, Martin A1 - Krause, M. A1 - Übensee, Hartmut ED - Cavallini, Anna ED - Estreicher, Stefan K. T1 - Carrier Transport on Dislocations T2 - International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013 Y1 - 2014 SN - 978-0-7354-1215-6 U6 - https://doi.org/10.1063/1.4865599 PB - AIP Publishing CY - Melville, New York ER - TY - GEN A1 - Reiche, Manfred A1 - Kittler, Martin A1 - Übensee, Hartmut A1 - Pippel, Eckhard A1 - Hopfe, Sigrid T1 - Dislocations as Native Nanostructures - Electronic Properties T2 - Advances in Nano Research Y1 - 2014 U6 - https://doi.org/10.12989/anr.2014.2.1.001 SN - 2287-2388 SN - 2287-237X VL - 2 IS - 1 SP - 1 EP - 14 ER - TY - GEN A1 - Reiche, Manfred A1 - Kittler, Martin A1 - Erfurth, Wilfried A1 - Pippel, Eckhard A1 - Sklarek, Kornelia A1 - Blumtritt, Horst A1 - Haehnel, Angelika A1 - Übensee, Hartmut T1 - On the Electronic Properties of a Single Dislocation T2 - Journal of Applied Physics Y1 - 2014 U6 - https://doi.org/10.1063/1.4876265 SN - 1089-7550 VL - 115 IS - 19 SP - 194303 ER -