TY - GEN A1 - Bielefeldt, Jens A1 - Basener, Kai-Uwe A1 - Khan, Siddique R. A1 - Massah, Mozhdeh A1 - Wiesbrock, Hans-Werner A1 - Scharoba, Stefan A1 - Hübner, Michael T1 - DeepTest: How Machine Learning Can Improve the Test of Embedded Systems  T2 - 10th Mediterranean Conference on Embedded Computing (MECO), 7-10 June 2021 Y1 - 2021 SN - 978-1-6654-3912-1 SN - 978-1-6654-2989-4 U6 - https://doi.org/10.1109/meco52532.2021.9460182 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Bielefeldt, Jens A1 - Basener, Kai-Uwe A1 - Khan, Siddique R. A1 - Massah, Mozhdeh A1 - Wiesbrock, Hans-Werner A1 - Scharoba, Stefan A1 - Hübner, Michael T1 - Einsatz von Deep Learning für den Test Eingebetteter Systeme  T2 - Informatik 2021: computer science & sustainability, 27. September-01. Oktober 2021, Berlin Y1 - 2021 SN - 978-3-88579-708-1 U6 - https://doi.org/10.18420/INFORMATIK2021-166 PB - Gesellschaft für Informatik e.V. CY - Bonn ER -