TY - GEN A1 - Azad, Siavoosh Payandeh A1 - Niazmand, Behrad A1 - Janson, Karl A1 - George, Nevin A1 - Oyeniran, Stephen Adeboye A1 - Putkaradze, Tsotne A1 - Kaur, Apneet A1 - Raik, Jaan A1 - Jervan, Gert A1 - Ubar, Raimund A1 - Hollstein, Thomas T1 - From online fault detection to fault management in Network-on-Chips: A ground-up approach T2 - IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Dresden, Germany, 19-21 April 2017 Y1 - 2017 SN - 978-1-5386-0472-4 SN - 978-1-5386-0473-1 U6 - https://doi.org/10.1109/DDECS.2017.7934565 SN - 2473-2117 ER -