TY - GEN A1 - Jenihhin, Maksim A1 - Hamdioui, Said A1 - Sonza-Reorda, Matteo A1 - Krstic, Milos A1 - Langendörfer, Peter A1 - Sauer, Christian A1 - Klotz, Anton A1 - Hübner, Michael A1 - Nolte, Jörg A1 - Vierhaus, Heinrich Theodor A1 - Selimis, Georgions A1 - Alexandrescu, Dan A1 - Taouil, Mottaqiallah A1 - Schrijen, Geert-Jan A1 - Sterpone, Luca A1 - Squillero, Giovanni A1 - Dyka, Zoya A1 - Raik, Jaan T1 - RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems T2 - ArXiv.org Y1 - 2019 UR - https://arxiv.org/abs/1912.01561 ER - TY - GEN A1 - Azad, Siavoosh Payandeh A1 - Niazmand, Behrad A1 - Janson, Karl A1 - George, Nevin A1 - Oyeniran, Stephen Adeboye A1 - Putkaradze, Tsotne A1 - Kaur, Apneet A1 - Raik, Jaan A1 - Jervan, Gert A1 - Ubar, Raimund A1 - Hollstein, Thomas T1 - From online fault detection to fault management in Network-on-Chips: A ground-up approach T2 - IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Dresden, Germany, 19-21 April 2017 Y1 - 2017 SN - 978-1-5386-0472-4 SN - 978-1-5386-0473-1 U6 - https://doi.org/10.1109/DDECS.2017.7934565 SN - 2473-2117 ER - TY - BOOK A1 - Vierhaus, Heinrich Theodor A1 - Steininger, Andreas A1 - Pawlak, A. A1 - Kraemer, Rolf A1 - Schölzel, Mario A1 - Raik, Jaan T1 - Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems Y1 - 2011 SN - 978-1-4244-9753-9 PB - Piscataway : IEEE, 2011 ER -