TY - CHAP A1 - Lau, Isabella A1 - Frank, Martin A1 - Shi, Kilin A1 - Lurz, Fabian A1 - Talai, Armin A1 - Weigel, Robert A1 - Kölpin, Alexander T1 - An Accurate Free Space Method for Material Characterization in W-Band Using Material Samples with Two Different Thicknesses T2 - Proceedings of the 48th European Microwave Conference, Madrid (Spain), 2018 Y1 - 2018 U6 - https://doi.org/10.23919/EuMC.2018.8541437 SP - 202 EP - 205 ER - TY - CHAP A1 - Lau, Isabella A1 - Michler, Fabian A1 - Talai, Armin A1 - Weigel, Robert A1 - Kölpin, Alexander T1 - A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz T2 - 2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) : 16-18 July 2018 Y1 - 2018 SN - 978-1-5386-5569-6 U6 - https://doi.org/10.1109/IMWS-AMP.2018.8457133 PB - IEEE CY - Piscataway, NJ ER - TY - GEN A1 - Lau, Isabella A1 - Hajian, Ali A1 - Michler, Fabian A1 - Gold, Gerald A1 - Lurz, Fabian A1 - Schmid, Ulrich A1 - Helmreich, Klaus A1 - Weigel, Robert A1 - Kölpin, Alexander T1 - Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz T2 - IEEE Transactions on Microwave Theory and Techniques Y1 - 2019 U6 - https://doi.org/10.1109/TMTT.2019.2910114 SN - 1557-9670 SN - 0018-9480 VL - 67 IS - 7 SP - 2793 EP - 2804 ER -