TY - CHAP A1 - Galke, Christian A1 - Kothe, René A1 - Schultke, Sabine A1 - Winkler, Christin A1 - Honko, Jeanette A1 - Vierhaus, Heinrich Theodor T1 - Embedded Scan Test with Diagnostic Features for Self-Testing SoCs T2 - Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006 KW - ICs KW - Test KW - Selbsttest Y1 - 2006 SN - 978-0-7695-2620-1 N1 - IEEE Computer Society SP - 181 EP - 182 PB - IEEE Computer Society CY - Los Alamitos, Calif. [u.a.] ER -