TY - GEN A1 - Reiche, Manfred A1 - Kittler, Martin A1 - Pippel, Eckhard A1 - Übensee, Hartmut A1 - Kosina, Hans A1 - Grill, Alexander A1 - Stanojevic, Zlatan A1 - Baumgartner, Oskar T1 - Impact of Defect-Induced Strain on Device Properties T2 - Advanced Engineering Materials Y1 - 2017 U6 - https://doi.org/10.1002/adem.201600736 SN - 1527-2648 N1 - Art.-Nr. 1600736 VL - 19 IS - 8 ER -