TY - CHAP A1 - Gleichner, Christian A1 - Koal, Tobias A1 - Vierhaus, Heinrich Theodor T1 - Effective Logic Self Repair Based on Extracted Logic Clusters T2 - Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan KW - ICs KW - SoCs KW - Zuverlässigkeit KW - Selbstreparatur Y1 - 2010 SN - 978-1-4577-1485-6 N1 - BTU PB - IEEE ER - TY - CHAP A1 - Gleichner, Christian A1 - Vierhaus, Heinrich Theodor A1 - Engelke, Piet T1 - Scan Based Tests Via Standard Interfaces T2 - 15th Euromicro Conference on Digital System Design (DSD), September 2012 Y1 - 2012 SN - 978-0-7695-4798-5 SN - 978-1-4673-2498-4 SP - 844 EP - 851 PB - IEEE CY - Piscataway ER - TY - CHAP A1 - Gleichner, Christian A1 - Vierhaus, Heinrich Theodor ED - Cunningham, Douglas William ED - Hofstedt, Petra ED - Meer, Klaus ED - Schmitt, Ingo T1 - Test eingebetteter Prozessoren im Zielsystem mit hoher diagnostischer Auflösung T2 - Informatik 2015, Tagung vom 28. September – 2. Oktober 2015 in Cottbus Y1 - 2015 SN - 978-3-88579-640-4 SP - 1399 EP - 1414 PB - Gesellschaft für Informatik CY - Bonn ER - TY - CHAP A1 - Pfeifer, Petr A1 - Gleichner, Christian A1 - Vierhaus, Heinrich Theodor T1 - Flexible Test, Error Detection and Correction in Dependable Communication Systems incl. Results on 28nm Xilinx and Altera FPGAs T2 - 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, 2016 Y1 - 2016 SN - 978-80-8086-256-5 SP - 26 EP - 31 ER - TY - CHAP A1 - Gleichner, Christian A1 - Vierhaus, Heinrich Theodor T1 - Test of automotive embedded processors with high diagnostic resolution T2 - 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, 2016 Y1 - 2016 SN - 978-80-8086-256-5 SP - 1 EP - 6 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Pfeifer, Petr A1 - Gleichner, Christian A1 - Vierhaus, Heinrich Theodor T1 - Forward Error Correction in Industrial Wireless Communication T2 - Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus Y1 - 2017 SN - 978-3-8007-4444-2 PB - VDE Verlag CY - Berlin ER -