TY - GEN A1 - Bär, Marcus A1 - Song, X. A1 - Caballero, R. A1 - Duarte, Roberto Felix A1 - Gerlach, Dominic A1 - Kaufmann, Christian A1 - Schock, Hans-Werner A1 - Wilks, Regan G. T1 - Na incorporation into Cu(In,Ga)Se2 thin-film solar cell absorbers deposited on polyimide: Impact on the chemical and electronic surface structure T2 - Journal of Applied Physics N2 - Na has deliberately been incorporated into Cu(In,Ga)Se2 (“CIGSe”) chalcopyrite thin-film solar cell absorbers deposited on Mo-coated polyimide flexible substrates by adding differently thick layers of NaF in-between CIGSe absorber and Mo back contact. The impact of Na on the chemical and electronic surface structure of CIGSe absorbers with various Cu-contents deposited at comparatively low temperature (420 °C) has been studied using x-ray photoelectron and x-ray excited Auger electron spectroscopy. We observe a higher Nasurface content for the Cu-richer CIGSe samples and can distinguish between two different chemical Na environments, best described as selenide-like and oxidized Na species, respectively. Furthermore, we find a Cu-poor surface composition of the CIGSe samples independent of Na content and — for very high Na contents — indications for the formation of a (Cu,Na)–(In,Ga)–Se like compound. With increasing Nasurface content, also a shift of the photoemission lines to lower binding energies could be identified, which we interpret as a reduction of the downward band bending toward the CIGSe surface explained by the Na-induced elimination of InCu defects. Y1 - 2012 SN - 1089-7550 VL - 111 IS - 3 SP - 034903 ER - TY - GEN A1 - Gerlach, Dominic A1 - Wippler, David A1 - Wilks, Regan G. A1 - Wimmer, Manuel A1 - Lozac'h, Mickaël A1 - Duarte, Roberto Felix A1 - Ueda, Shigenori A1 - Yoshikawa, Hideki A1 - Lips, Klaus A1 - Rech, Bernd A1 - Sumiya, Masatomo A1 - Kobayashi, Kaoru A1 - Gorgoi, Mihaela A1 - Hüpkes, Jürgen A1 - Bär, Marcus T1 - p-Type a-Si:H/ZnO:Al and μc-Si:H/ZnO:Al Thin-Film Solar Cell Structures—A Comparative Hard X-Ray Photoelectron Spectroscopy Study T2 - IEEE journal of photovoltaics N2 - The chemical and electronic properties of a- Si:H(B)/ZnO:Al and μc-Si:H(B)/ZnO:Al thin-film solar cell structures are studied by hard X-ray photoelectron spectroscopy (HAXPES). Using a combination of different X-ray excitation energies and deliberate sample design, we were able to select the probed volume, i.e., the silicon capping layer only or the silicon and zinc oxide layer (including the buried interface). For the a-Si:H(B) material, we find a higher deposition rate and a smaller value for the modified Auger parameter than for μc-Si:H(B). In addition, we find indications of a pronounced band bending limited to the very surface of the a-Si:H(B) and the μc-Si:H(B) layers, which is more distinct in the latter case. Y1 - 2013 SN - 2156-3381 VL - 3 IS - 1 SP - 483 EP - 487 ER - TY - GEN A1 - Bär, Marcus A1 - Theisen, J.-P. A1 - Wilks, Regan G. A1 - Erfurth, Felix A1 - Duarte, Roberto Felix A1 - Gerlach, Dominic A1 - Haas, S. A1 - Tati-Bismaths, L. A1 - Reinert, F. A1 - Kronast, F. A1 - Niesen, T. P. A1 - Palm, Jörg A1 - Visbeck, Sven A1 - Weinhardt, Lothar T1 - Lateral inhomogeneity of the Mg/(Zn+Mg) composition at the (Zn,Mg)O/CuIn(S,Se)2 thin-film solar cell interface revealed by photoemission electron microscopy T2 - Journal of Applied Physics N2 - Spatial variations in the chemical composition of the (Zn,Mg)O/CuIn(S,Se)2 thin-film solar cell interface were studied by photoemission electron microscopy (PEEM). Energy filtered PEEM images indicate significant differences in the magnesium and zinc distribution. Local photoemission measurements reveal a relative difference in the derived Mg/(ZnþMg) composition of the (Zn,Mg)O material of up to (11.460.7)%, which can be expected to induce band gap fluctuations of (60630) meV. Furthermore, local areas with significant accumulations of sodium could be observed. Y1 - 2013 U6 - https://doi.org/10.1063/1.4804413 SN - 1520-8850 VL - 113 IS - 19 SP - 193709 ER - TY - GEN A1 - Gorgoi, Mihaela A1 - Gerlach, Dominic A1 - Wilks, Regan G. A1 - Wippler, David A1 - Wimmer, Manuel A1 - Lozac'h, Mickaël A1 - Duarte, Roberto Felix A1 - Mück, Leonie Anna A1 - Meier, M. A1 - Ueda, Shigenori A1 - Yoshikawa, Hideki A1 - Lips, Klaus A1 - Rech, Bernd A1 - Sumiya, Masatomo A1 - Hüpkes, Jürgen A1 - Kobayashi, Kaoru A1 - Bär, Marcus T1 - The silicon/zinc oxide interface in amorphous silicon-based thin-film solar cells: Understanding an empirically optimized contact T2 - Applied Physics Letters N2 - The electronic structure of the interface between the boron-doped oxygenated amorphous silicon “window layer” (a-SiOx:H(B)) and aluminum-doped zinc oxide (ZnO:Al) was investigated using hard x-ray photoelectron spectroscopy and compared to that of the boron-doped microcrystalline silicon (μc-Si:H(B))/ZnO:Al interface. The corresponding valence band offsets have been determined to be (−2.87 ± 0.27) eV and (−3.37 ± 0.27) eV, respectively. A lower tunnel junction barrier height at the μc-Si:H(B)/ZnO:Al interface compared to that at the a-SiOx:H(B)/ZnO:Al interface is found and linked to the higher device performances in cells where a μc-Si:H(B) buffer between the a-Si:H p-i-n absorber stack and the ZnO:Al contact is employed. Y1 - 2013 SN - 1077-3118 VL - 103 IS - 2 SP - 023903 ER - TY - THES A1 - Gerlach, Dominic T1 - Surface and interface characterization of thin-film silicon solar cell structures Y1 - 2013 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus-28254 UR - http://opus.kobv.de/btu/volltexte/2013/2825/ N1 - Prof. Schmeißer Zweitgutachter ER - TY - GEN A1 - Wippler, David A1 - Wilks, Regan G. A1 - Pieters, Bart E. A1 - Albada, Sacha Jennifer van A1 - Gerlach, Dominic A1 - Hüpkes, Jürgen A1 - Bär, Marcus A1 - Rau, Uwe T1 - Pronounced surface band bending of thin-film silicon revealed by modeling core levels probed with hard x-rays T2 - ACS Applied Materials & Interfaces Y1 - 2016 U6 - https://doi.org/10.1021/acsami.6b04666 SN - 1944-8252 SN - 1944-8244 VL - 8 IS - 27 SP - 17685 EP - 17693 ER -