TY - GEN A1 - Fischer, Simon A1 - Krisponeit, Jon-Olaf A1 - Foerster, Michael A1 - Aballe, Lucia A1 - Falta, Jens A1 - Flege, Jan Ingo T1 - Massively Strained VO2 Thin Film Growth on RuO2 T2 - Crystal Growth & Design N2 - Strain engineering vanadium dioxide thin films is one way to alter this material’s characteristic first order transition from semiconductor to metal. In this study, we extend the exploitable strain regime by utilizing the very large lattice mismatch of 8.78% occurring in the VO2/RuO2 system along the c axis of the rutile structure. We have grown VO2 thin films on single-domain RuO2 islands of two distinct surface orientations by atomic oxygen-supported reactive molecular beam epitaxy (MBE). These films were examined by spatially resolved photoelectron and X-ray absorption spectroscopy, confirming the correct stoichiometry. Low energy electron diffraction then reveals the VO2 films grow indeed fully strained on RuO2(110), exhibiting a previously unreported (2 × 2) reconstruction. On TiO2(110) substrates, we reproduce this reconstruction and attribute it to an oxygen-rich termination caused by the high oxygen chemical potential. On RuO2(100), on the contrary, the films grow fully relaxed. Hence, the presented growth method allows for simultaneous access to a remarkable strain window ranging from bulk-like structures to massively strained regions. KW - strain engineering KW - vanadium dioxide (VO2) KW - ruthenium dioxide (RuO2) KW - reactive molecular beam epitaxy (MBE) KW - low energy electron microscopy (LEEM) KW - photoemission electron microscopy (PEEM) KW - low energy electron diffraction (LEED) KW - XPEEM KW - µLEED Y1 - 2020 U6 - https://doi.org/10.1021/acs.cgd.0c00120 SN - 1528-7483 SN - 1528-7505 VL - 20 IS - 4 SP - 2734 EP - 2741 ER - TY - GEN A1 - Krisponeit, Jon-Olaf A1 - Fischer, Simon A1 - Esser, Sven A1 - Moshnyaga, Vasily A1 - Schmidt, Thomas A1 - Piper, Louis F. J. A1 - Flege, Jan Ingo A1 - Falta, Jens T1 - The morphology of VO2/TiO2(001): terraces, facets, and cracks T2 - Scientific Reports N2 - Vanadium dioxide (VO2) features a pronounced, thermally-driven metal-to-insulator transition at 340 K. Employing epitaxial stress on rutile TiO2(001) substrates, the transition can be tuned to occur close to room temperature. Striving for applications in oxide-electronic devices, the lateral homogeneity of such samples must be considered as an important prerequisite for efforts towards miniaturization. Moreover, the preparation of smooth surfaces is crucial for vertically stacked devices and, hence, the design of functional interfaces. Here, the surface morphology of VO2/TiO2(001) films was analyzed by low-energy electron microscopy and diffraction as well as scanning probe microscopy. The formation of large terraces could be achieved under temperature-induced annealing, but also the occurrence of facets was observed and characterized. Further, we report on quasi-periodic arrangements of crack defects which evolve due to thermal stress under cooling. While these might impair some applicational endeavours, they may also present crystallographically well-oriented nano-templates of bulk-like properties for advanced approaches. KW - Vanadium dioxide (VO2) KW - rutile TiO2(001) KW - metal-to-insulator transition KW - morphology KW - crystallography KW - low-energy electron microscopy (LEEM) KW - low-energy electron diffraction (LEED) KW - scanning probe microscopy Y1 - 2020 U6 - https://doi.org/10.1038/s41598-020-78584-9 SN - 2045-2322 VL - 10 ER -